View source for Micron technology, inc. (20240248612). PROGRAM PULSE MODIFICATION simplified abstract

=PROGRAM PULSE MODIFICATION=


==Organization Name==

[[:Category:micron technology, inc.|micron technology, inc.]]


[[Category:micron technology, inc.]]

==Inventor(s)==

[[:Category:Lei Lin of Fremont CA (US)|Lei Lin of Fremont CA (US)]][[Category:Lei Lin of Fremont CA (US)]]

[[:Category:Peng Zhang of Los Altos CA (US)|Peng Zhang of Los Altos CA (US)]][[Category:Peng Zhang of Los Altos CA (US)]]

[[:Category:Pitamber Shukla of San Jose CA (US)|Pitamber Shukla of San Jose CA (US)]][[Category:Pitamber Shukla of San Jose CA (US)]]

[[:Category:Zhengang Chen of San Jose CA (US)|Zhengang Chen of San Jose CA (US)]][[Category:Zhengang Chen of San Jose CA (US)]]

[[:Category:Zhenming Zhou of San Jose CA (US)|Zhenming Zhou of San Jose CA (US)]][[Category:Zhenming Zhou of San Jose CA (US)]]

==PROGRAM PULSE MODIFICATION - A simplified explanation of the abstract==


This abstract first appeared for US patent application 20240248612 titled 'PROGRAM PULSE MODIFICATION

The abstract of this patent application describes a system component, such as a memory sub-system controller, that is configured to modify pulses used to program memory components. The controller receives a request to program data in an individual memory component and computes multiple memory reliability criteria associated with that component. Based on the comparison of these criteria to threshold values, the controller selects a program pulse to program the data.

* The system component, like a memory sub-system controller, is designed to adjust programming pulses for memory components.
* Upon receiving a data programming request for a specific memory component, the controller calculates various memory reliability criteria for that component.
* The controller then compares these criteria to preset threshold values to determine the appropriate program pulse for data programming.

Potential Applications:
- This technology can be applied in various memory systems where reliability and efficiency are crucial.
- It can be utilized in data storage devices, embedded systems, and other memory-dependent applications.

Problems Solved:
- Enhances the reliability and efficiency of memory programming processes.
- Allows for customized programming based on specific memory component characteristics.

Benefits:
- Improved memory programming accuracy and reliability.
- Enhanced performance and longevity of memory components.
- Customized programming for optimal data storage and retrieval.

Commercial Applications:
Title: Enhanced Memory Programming System for Improved Data Storage
This technology can be commercialized in the data storage industry for manufacturing memory devices with higher reliability and performance. It can also be integrated into embedded systems for improved data processing capabilities.

Questions about Memory Programming System:
1. How does this technology improve the reliability of memory programming processes?
- This technology enhances reliability by customizing programming pulses based on specific memory component characteristics, ensuring optimal data storage.

2. What are the potential applications of this memory programming system beyond data storage devices?
- This system can be applied in embedded systems, IoT devices, and other memory-dependent applications to enhance performance and reliability.


==Original Abstract Submitted==

aspects of the present disclosure configure a system component, such as a memory sub-system controller, to modify pulses used to program memory components. the controller receives a request to program data in an individual memory component of a set of memory components. the controller computes a plurality of memory reliability criteria associated with the individual memory component and compares the plurality of memory reliability criteria to one or more threshold values. the controller selects a program pulse used to program the data to the individual memory component based on a result of comparing the plurality of memory reliability criteria to the one or more threshold values.



[[Category:G06F3/06]]
[[Category:CPC_G06F3/0619]]