View source for Micron technology, inc. (20240233806). APPARATUSES, SYSTEMS, AND METHODS FOR DATA TIMING ALIGNMENT WITH FAST ALIGNMENT MODE simplified abstract

=APPARATUSES, SYSTEMS, AND METHODS FOR DATA TIMING ALIGNMENT WITH FAST ALIGNMENT MODE=


==Organization Name==

[[:Category:micron technology, inc.|micron technology, inc.]]


[[Category:micron technology, inc.]]

==Inventor(s)==

[[:Category:BAOKANG Wang of Sagamihara (JP)|BAOKANG Wang of Sagamihara (JP)]][[Category:BAOKANG Wang of Sagamihara (JP)]]

[[:Category:TAKUYA Miyagi of Sagamihara (JP)|TAKUYA Miyagi of Sagamihara (JP)]][[Category:TAKUYA Miyagi of Sagamihara (JP)]]

==APPARATUSES, SYSTEMS, AND METHODS FOR DATA TIMING ALIGNMENT WITH FAST ALIGNMENT MODE - A simplified explanation of the abstract==


This abstract first appeared for US patent application 20240233806 titled 'APPARATUSES, SYSTEMS, AND METHODS FOR DATA TIMING ALIGNMENT WITH FAST ALIGNMENT MODE

==Simplified Explanation==
The patent application describes apparatuses, systems, and methods for data timing alignment with a fast alignment mode in a stacked memory device. The device includes an interface die and multiple core die, each with an adjustable delay circuit controlled by delay codes based on measured phase differences.

* The patent application focuses on data timing alignment in a stacked memory device.
* It introduces a fast alignment mode for quick and efficient adjustment of delay circuits.
* The device includes an interface die and core die, each with adjustable delay circuits controlled by delay codes.
* The delay codes are adjusted based on measured phase differences along a replica path.
* In a default maintenance state, the delay codes are adjusted using an average of phase differences over time.
* The interface die tracks phase differences and adjusts count values associated with core die accordingly.
* If count values cross a threshold, the device enters a different delay adjustment state without averaging.
* This allows for correction of systemic errors such as voltage drift.

==Potential Applications==
The technology described in the patent application can be applied in various fields such as:
* Memory devices
* Data processing systems
* Communication systems
* Networking equipment

==Problems Solved==
The technology addresses the following problems:
* Efficient data timing alignment in stacked memory devices
* Quick adjustment of delay circuits
* Correction of systemic errors like voltage drift

==Benefits==
The benefits of this technology include:
* Improved data timing alignment accuracy
* Faster adjustment of delay circuits
* Enhanced system performance and reliability

==Commercial Applications==
Title: Fast Data Timing Alignment Technology for Memory Devices
This technology can have significant commercial applications in:
* Semiconductor industry
* Data centers
* Telecommunications sector
* Consumer electronics market

==Prior Art==
Readers interested in prior art related to this technology can explore research papers, patents, and industry publications on data timing alignment in memory devices, phase difference measurement, and delay circuit adjustment.

==Frequently Updated Research==
Researchers and developers in the field of memory devices and data processing systems frequently update studies on data timing alignment techniques, phase difference measurement methods, and delay circuit optimization.

==Questions about Data Timing Alignment Technology==
1. How does the fast alignment mode in the stacked memory device improve data processing efficiency?
   - The fast alignment mode allows for quick adjustment of delay circuits, leading to improved data timing alignment accuracy and system performance.
2. What are the potential implications of voltage drift on data timing alignment in memory devices?
   - Voltage drift can introduce systemic errors in data timing alignment, affecting the overall performance and reliability of the system.


==Original Abstract Submitted==

apparatuses, systems, and methods for data timing alignment with fast alignment mode. a stacked memory device includes an interface die and a number of core die. the interface and the core die each have an adjustable delay circuit adjusted by an interface delay code or a respective core delay code. the delay codes are adjusted based on a measured phase difference along a replica path. in a default maintenance state, the delay codes may be adjusted based on an average of the phase differences over time. each time the phase difference matches a previous phase difference, the interface die changes a count value associated with that core die. if one or more of the count values cross a threshold, a state machine of the interface die enters a different delay adjustment state where averaging is not used. this may allow for correction of systemic errors such as voltage drift.



[[Category:G11C11/4076]]
[[Category:CPC_G11C11/4076]]