View source for Micron technology, inc. (20240160266). SELECTIVELY USING HEROIC DATA RECOVERY METHODS IN A MEMORY DEVICE simplified abstract

=SELECTIVELY USING HEROIC DATA RECOVERY METHODS IN A MEMORY DEVICE=


==Organization Name==

[[:Category:micron technology, inc.|micron technology, inc.]]


[[Category:micron technology, inc.]]

==Inventor(s)==

[[:Category:Curtis W. Egan of Brighton CO (US)|Curtis W. Egan of Brighton CO (US)]][[Category:Curtis W. Egan of Brighton CO (US)]]

==SELECTIVELY USING HEROIC DATA RECOVERY METHODS IN A MEMORY DEVICE - A simplified explanation of the abstract==


This abstract first appeared for US patent application 20240160266 titled 'SELECTIVELY USING HEROIC DATA RECOVERY METHODS IN A MEMORY DEVICE

==Simplified Explanation==

The patent application abstract describes a method for detecting and recovering corrupt data in a storage block by comparing voltage distribution data with reference data.

* The method involves detecting a block storing corrupt data.
* Accessing threshold voltage distribution data for the block.
* Comparing the distribution data with reference distributions.
* Determining whether to perform data recovery processes based on the comparison.

== Potential Applications ==
This technology could be applied in data storage systems, such as solid-state drives, to improve data integrity and reliability.

== Problems Solved ==
This technology addresses the issue of corrupt data in storage blocks, ensuring data accuracy and preventing data loss.

== Benefits ==
The benefits of this technology include enhanced data recovery processes, improved data reliability, and increased overall system performance.

== Potential Commercial Applications ==
This technology could be utilized in various industries that rely on data storage systems, such as cloud computing, data centers, and telecommunications.

== Possible Prior Art ==
One possible prior art for this technology could be methods for data recovery and error correction in storage devices.

=== What is the impact of this technology on data storage systems? ===

This technology has the potential to significantly improve the reliability and integrity of data stored in systems, reducing the risk of data loss and enhancing overall system performance.

=== How does this technology compare to existing data recovery methods? ===

This technology offers a more proactive approach to data recovery by detecting corrupt data blocks and comparing them with reference data, allowing for more efficient and targeted recovery processes.


==Original Abstract Submitted==

a block storing corrupt data is detected. based on detecting the block storing corrupt data, threshold voltage (v) distribution data corresponding to the block is accessed. the vdistribution data comprises one or more vdistribution measurements corresponding to the block. the vdistribution data corresponding to the block is compared with reference vdistribution data. the reference vdistribution data comprises one or more reference vdistributions. based on a result of the comparison, it is determined whether to perform one or more heroic data recovery processes on the block.



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