View source for METHOD AND APPARATUS FOR ASCERTAINING A PARAMETER, SAID PARAMETER CHARACTERIZING A CURRENT OR A VOLTAGE IN A CIRCUIT ARRANGEMENT: abstract simplified (18041920)

*This abstract for appeared for patent application  number 18041920 Titled 'METHOD AND APPARATUS FOR ASCERTAINING A PARAMETER, SAID PARAMETER CHARACTERIZING A CURRENT OR A VOLTAGE IN A CIRCUIT ARRANGEMENT'

==Simplified Explanation==

The abstract describes a method for determining a parameter that characterizes a current or voltage in a circuit arrangement. The circuit arrangement includes an inductor through which an alternating choke current flows. The method involves determining the duration between two zero crossings of the choke current or the duration between a zero crossing and an apex of the choke current. Based on these durations, the parameter is calculated.


==Original Abstract Submitted==

Disclosed is a method () for ascertaining a parameter (I_avg, I_N, I_P, V_c), said parameter (I_avg, I_N, I_P, V_c) characterizes a current or a voltage in a circuit arrangement (). The circuit arrangement () comprises an inductor (L) through which an alternating choke current (I_L) flows. The method comprises the steps of: ascertaining () at least one duration (TN) between two zero crossings (N_−, N_+)+) of the choke current (I_L), or a duration (TNE) between a zero crossing (N_−, N_+)+) and an apex (E_−, E_+) of the choke current (I_L); ascertaining () the parameter (I_avg, I_N, I_P, V_c) according to the ascertained duration (TN, TNE).