View source for Japan display inc. (20250146940). INSPECTION METHOD OF LIGHT-EMITTING ELEMENT

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=INSPECTION METHOD OF LIGHT-EMITTING ELEMENT=


==Organization Name==

[[:Category:japan display inc.|japan display inc.]]


[[Category:japan display inc.]]

==Inventor(s)==

[[:Category:Masanobu Ikeda of Tokyo JP|Masanobu Ikeda of Tokyo JP]][[Category:Masanobu Ikeda of Tokyo JP]]

==INSPECTION METHOD OF LIGHT-EMITTING ELEMENT==


This abstract first appeared for US patent application 20250146940 titled 'INSPECTION METHOD OF LIGHT-EMITTING ELEMENT

==Original Abstract Submitted==

disclosed is a method for inspecting a light-emitting element, the method including: forming a buffer layer over an amorphous substrate; forming, over the buffer layer, an n-type cladding layer, an emission layer, and a p-type cladding layer each including an inorganic semiconductor to form a plurality of semiconductor layers arranged in a matrix form having a plurality of rows and a plurality of columns; forming an anode and a cathode over each of the plurality of semiconductor layers to form a plurality of light-emitting elements; and acquiring at least one of a photoluminescence property or an electroluminescence property of the plurality of light-emitting elements using a first detector and a second detector. the buffer layer has a function to promote crystallization of the semiconductor layers. the photoluminescence property is acquired before forming the anode and the cathode. the electroluminescence property is acquired after forming the anode and the cathode.



[[Category:G01N21/64]]
[[Category:G01N21/66]]
[[Category:CPC_G01N21/6489]]