View source for IQM FINLAND OY (20240412093). CHARACTERIZATION OF QUBIT ENVIRONMENT

=CHARACTERIZATION OF QUBIT ENVIRONMENT=


==Organization Name==

[[:Category:IQM FINLAND OY|IQM FINLAND OY]]


[[Category:IQM FINLAND OY]]

==Inventor(s)==

[[:Category:Miha Papic of Munich (DE)|Miha Papic of Munich (DE)]][[Category:Miha Papic of Munich (DE)]]

[[:Category:Inés De Vega of Munich (DE)|Inés De Vega of Munich (DE)]][[Category:Inés De Vega of Munich (DE)]]

==CHARACTERIZATION OF QUBIT ENVIRONMENT==


This abstract first appeared for US patent application 20240412093 titled 'CHARACTERIZATION OF QUBIT ENVIRONMENT




==Original Abstract Submitted==

there is provided a method for obtaining information on one or more error sources affecting dynamics of at least one qubit, the method comprising: receiving at least one characterizing measurement of at least one qubit configured to act as a sensor for the one or more error sources affecting dynamics of the at least one qubit; determining, based on the at least one characterizing measurement, at least one characterizing signal, which describes the dynamics of the at least one qubit; providing the at least one characterizing signal as an input to a neural network trained to predict information on the one or more error sources affecting the at least one characterizing signal; and receiving as an output, from the neural network, information on the one or more error sources affecting the at least one characterizing signal.



[[Category:G06N10/70]]
[[Category:G06N10/40]]
[[Category:CPC_G06N10/70]]