View source for Huawei technologies co., ltd. (20240120995). SYSTEMS AND METHODS FOR DETECTING A LOCATION OF THE OPTICAL ELEMENTS CAUSING MULTIPATH INTERFERENCE IN AN OPTICAL LINK simplified abstract

=SYSTEMS AND METHODS FOR DETECTING A LOCATION OF THE OPTICAL ELEMENTS CAUSING MULTIPATH INTERFERENCE IN AN OPTICAL LINK=


==Organization Name==

[[:Category:huawei technologies co., ltd.|huawei technologies co., ltd.]]


[[Category:huawei technologies co., ltd.]]

==Inventor(s)==

[[:Category:Zhiping Jiang of Kanata (CA)|Zhiping Jiang of Kanata (CA)]][[Category:Zhiping Jiang of Kanata (CA)]]

==SYSTEMS AND METHODS FOR DETECTING A LOCATION OF THE OPTICAL ELEMENTS CAUSING MULTIPATH INTERFERENCE IN AN OPTICAL LINK - A simplified explanation of the abstract==


This abstract first appeared for US patent application 20240120995 titled 'SYSTEMS AND METHODS FOR DETECTING A LOCATION OF THE OPTICAL ELEMENTS CAUSING MULTIPATH INTERFERENCE IN AN OPTICAL LINK

==Simplified Explanation==

The disclosed systems and methods for detecting a location of reflection in an optical link involve receiving an optical signal, receiving a plurality of first type of delayed optical signals corresponding to the optical signal, determining first type of time delays associated with each of the delayed optical signals, receiving a plurality of second type of delayed optical signals corresponding to the optical signal, determining second type of time delays associated with each of the delayed optical signals, computing relative delays from the second type of time delays, comparing the relative delays with the first type of time delays, and determining a location of a given optical element contributing to the reflections based on the relative delay and the location of the optical element.

* Receiving an optical signal
* Receiving delayed optical signals
* Determining time delays associated with the delayed optical signals
* Computing relative delays
* Comparing relative delays with time delays
* Determining location of optical element contributing to reflections

== Potential Applications ==
This technology can be applied in telecommunications, fiber optic networks, and optical signal processing.

== Problems Solved ==
This technology solves the problem of accurately detecting the location of reflections in an optical link, which can help in troubleshooting and optimizing optical networks.

== Benefits ==
The benefits of this technology include improved efficiency in identifying and resolving issues in optical links, leading to better performance and reliability of optical communication systems.

== Potential Commercial Applications ==
One potential commercial application of this technology is in the field of optical network maintenance and optimization services.

== Possible Prior Art ==
One possible prior art in this field is the use of time-domain reflectometry (TDR) techniques for locating faults in cables and transmission lines. 

=== Unanswered Questions ===

=== How does this technology compare to existing methods for detecting reflections in optical links? ===
This article does not provide a direct comparison with existing methods for detecting reflections in optical links. 

=== What are the limitations of this technology in terms of detecting reflections in complex optical networks? ===
This article does not address the limitations of this technology in detecting reflections in complex optical networks.


==Original Abstract Submitted==

the disclosed systems and methods for detecting a location of reflection in an optical link comprising: i) receiving an optical signal; ii) receiving a plurality of first type of delayed optical signals corresponding to the optical signal; iii) determining a first type of time delays associated with each of the plurality of first type of delayed optical signals; iv) receiving a plurality of second type of delayed optical signals corresponding to the optical signal; v) determining a second type of time delays associated with the each of the plurality of second type of delayed optical signals; vi) computing relative delays from the second type of time delays; vii) comparing the relative delays with the first type of time delays; and viii) determining a location of a given optical element contributing to the reflections based on the given relative delay and the location of the ar.



[[Category:H04B10/075]]
[[Category:H04B10/61]]
[[Category:H04B10/67]]