View source for Apple inc. (20250110165). Electrostatic Discharge Testing

=Electrostatic Discharge Testing=


==Organization Name==

[[:Category:apple inc.|apple inc.]]


[[Category:apple inc.]]

==Inventor(s)==

[[:Category:Shaowu Huang of Los Altos CA US|Shaowu Huang of Los Altos CA US]][[Category:Shaowu Huang of Los Altos CA US]]

[[:Category:Jing Li Lim of Sunnyvale CA US|Jing Li Lim of Sunnyvale CA US]][[Category:Jing Li Lim of Sunnyvale CA US]]

[[:Category:Keong W. Kam of San Jose CA US|Keong W. Kam of San Jose CA US]][[Category:Keong W. Kam of San Jose CA US]]

[[:Category:Ramachandran Chundru of Cupertino CA US|Ramachandran Chundru of Cupertino CA US]][[Category:Ramachandran Chundru of Cupertino CA US]]

==Electrostatic Discharge Testing==


This abstract first appeared for US patent application 20250110165 titled 'Electrostatic Discharge Testing

==Original Abstract Submitted==

a method for electrostatic discharge testing of a head-mounted device including a housing and a headband coupled to the housing includes the steps of applying a shielding material to the head-mounted device such that the shielding material covers an outer surface of the housing and an outer surface of the headband, removing a first portion of the shielding material from a first area of the head-mounted device, applying an electrical charge to the head-mounted device, and assessing the head-mounted device for coupling paths associated with an electrostatic discharge failure.



[[Category:G01R31/00]]
[[Category:G02B27/01]]
[[Category:G06F1/16]]
[[Category:H01R13/648]]
[[Category:H05K9/00]]
[[Category:CPC_G01R31/002]]