View source for 20250231020. Coating Thickness Measuring Devi (LG Chem, .)

= Coating Thickness Measuring Device and Coating Device Including the Same =

'''Abstract''':
a coating thickness measuring device is configured to measure a thickness of a coating material applied to a substrate which is fed by a coating roll on which the substrate is rolled. the coating thickness measuring device includes a coating thickness measurement module, wherein the coating thickness measurement module includes a light applying unit configured to apply light to a surface of the coating material applied to a portion of the substrate rolled on the coating roll, a light acquisition unit configured to acquire light reflected from the surface of the coating material, and a processor configured to calculate the thickness of the coating material based on the acquired light. accordingly, when measuring the thickness of the coating material the thickness measurement accuracy may be improved. a coating device including the same is also provided.

'''Inventor(s)''': [[:Category:Do-Hyun Lee of Daejeon  KR|Do-Hyun Lee]], [[:Category:Seung-Heon Lee of Daejeon  KR|Seung-Heon Lee]]

'''CPC Classification''': [[:Category:CPC_G01B11/0625|G01B11/0625]] (MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS)


[[Category:Patent Applications]]
[[Category:LG Chem, Ltd.]]
[[Category:CPC_G01B11/0625]]
[[Category:Do-Hyun Lee of Daejeon  KR]]
[[Category:Seung-Heon Lee of Daejeon  KR]]

[https://wikipatents.org/index.php?search=20250231020+rejection&title=Special%3ASearch&wprov=acrw1_-1 Search for rejections for patent application number 20250231020]


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