View source for 18938663. HANDLING POSITIONING MEASUREMENT (NOKIA TECHNOLOGIES OY)

<!-- JSON-LD markup for search engines:
{"@context":"https://schema.org","@type":"TechArticle","headline":"HANDLING POSITIONING MEASUREMENT","name":"HANDLING POSITIONING MEASUREMENT","description":"Example embodiments of the present disclosure relate to a solution for handling positioning measurement. In this solution, a first apparatus may determine a relationship between a completion time of a...","datePublished":"2024-11-06","mainEntity":{"@type":"Patent","identifier":"18938663","name":"HANDLING POSITIONING MEASUREMENT","abstract":"Example embodiments of the present disclosure relate to a solution for handling positioning measurement. In this solution, a first apparatus may determine a relationship between a completion time of a positioning measurement and an availability time of a serving cell of the first apparatus, or a first time length of a duration for performing the positioning measurement and a second time length of a validity duration of an uplink synchronization parameter in the serving cell. Then based on the determined relationship, the mobility activities may be processed properly.","applicationNumber":"18938663","datePublished":"2024-11-06","inventor":[{"@type":"Person","name":"Mads LAURIDSEN"},{"@type":"Person","name":"Ping YUAN"},{"@type":"Person","name":"Jing Yuan SUN"},{"@type":"Person","name":"Srinivasan SELVAGANAPATHY"}],"applicant":{"@type":"Organization","name":"NOKIA TECHNOLOGIES OY"},"additionalProperty":[{"@type":"PropertyValue","name":"IPC Classification","value":"H04W64/00"},{"@type":"PropertyValue","name":"IPC Classification","value":"H04L5/00"},{"@type":"PropertyValue","name":"IPC Classification","value":"H04W36/08"},{"@type":"PropertyValue","name":"IPC Classification","value":"H04W56/00"},{"@type":"PropertyValue","name":"IPC Classification","value":"H04W76/19"},{"@type":"PropertyValue","name":"CPC Classification","value":"H04W64/00"}]}}
-->

=HANDLING POSITIONING MEASUREMENT=


==Organization Name==

[[:Category:NOKIA TECHNOLOGIES OY|NOKIA TECHNOLOGIES OY]]


[[Category:NOKIA TECHNOLOGIES OY]]

==Inventor(s)==

[[:Category:Mads Lauridsen of Aalborg DK|Mads Lauridsen of Aalborg DK]][[Category:Mads Lauridsen of Aalborg DK]]

[[:Category:Ping Yuan of Beijing CN|Ping Yuan of Beijing CN]][[Category:Ping Yuan of Beijing CN]]

[[:Category:Jing Yuan Sun of Beijing CN|Jing Yuan Sun of Beijing CN]][[Category:Jing Yuan Sun of Beijing CN]]

[[:Category:Srinivasan Selvaganapathy of Bangalore IN|Srinivasan Selvaganapathy of Bangalore IN]][[Category:Srinivasan Selvaganapathy of Bangalore IN]]

==HANDLING POSITIONING MEASUREMENT==


This abstract first appeared for US patent application 18938663 titled 'HANDLING POSITIONING MEASUREMENT

==Original Abstract Submitted==

Example embodiments of the present disclosure relate to a solution for handling positioning measurement. In this solution, a first apparatus may determine a relationship between a completion time of a positioning measurement and an availability time of a serving cell of the first apparatus, or a first time length of a duration for performing the positioning measurement and a second time length of a validity duration of an uplink synchronization parameter in the serving cell. Then based on the determined relationship, the mobility activities may be processed properly.



[[Category:H04W64/00]]
[[Category:H04L5/00]]
[[Category:H04W36/08]]
[[Category:H04W56/00]]
[[Category:H04W76/19]]
[[Category:CPC_H04W64/00]]