View source for 18899634. IMAGE SENSING DEVICE INCLUDING TEST PATTERN (SK hynix Inc.)

=IMAGE SENSING DEVICE INCLUDING TEST PATTERN=


==Organization Name==

[[:Category:SK hynix Inc.|SK hynix Inc.]]


[[Category:SK hynix Inc.]]

==Inventor(s)==

[[:Category:Gon Ji Lee of Icheon-si KR|Gon Ji Lee of Icheon-si KR]][[Category:Gon Ji Lee of Icheon-si KR]]

==IMAGE SENSING DEVICE INCLUDING TEST PATTERN==


This abstract first appeared for US patent application 18899634 titled 'IMAGE SENSING DEVICE INCLUDING TEST PATTERN

==Original Abstract Submitted==

An image sensing device includes a pixel array including pixel units that include first pixel transistors located in different rows of the pixel array; first upper signal lines respectively connected to the first pixel transistors; a first test line commonly connected to the first upper signal lines; a first test pad connected to the first test line and configured to provide a first test signal to the first test line; and a first test transistor connected to the first test line and the first test pad and configured to enable or disable a test operation by selectively providing the first test signal to the first test line. During the test operation, the first test signal may be provided to the first pixel transistors located in different rows of the pixel array through the first test transistor, the first test line, and the first upper signal lines.



[[Category:H04N25/69]]
[[Category:H01L27/146]]
[[Category:H04N25/78]]
[[Category:CPC_H04N25/69]]