View source for 18800707. TESTING DEVICE (MILWAUKEE ELECTRIC TOOL CORPORATION)

=TESTING DEVICE=


==Organization Name==

[[:Category:MILWAUKEE ELECTRIC TOOL CORPORATION|MILWAUKEE ELECTRIC TOOL CORPORATION]]


[[Category:MILWAUKEE ELECTRIC TOOL CORPORATION]]

==Inventor(s)==

[[:Category:Benjamin Oliver Ryan Cabot of Milwaukee WI (US)|Benjamin Oliver Ryan Cabot of Milwaukee WI (US)]][[Category:Benjamin Oliver Ryan Cabot of Milwaukee WI (US)]]

[[:Category:Gareth Mueckl of Milwaukee WI (US)|Gareth Mueckl of Milwaukee WI (US)]][[Category:Gareth Mueckl of Milwaukee WI (US)]]

==TESTING DEVICE==


This abstract first appeared for US patent application 18800707 titled 'TESTING DEVICE

==Original Abstract Submitted==

A testing device including a main housing, and a probe housing, wherein the probe housing is rotatably coupled to the main housing. The testing device further includes a first test probe and a second test probe. The first test probe may be configured to be inserted into an alternating-current receptacle. The second test probe is coupled to the probe housing. The second test probe may be configured to be inserted into a universal serial bus receptacle.



[[Category:G01R31/327]]
[[Category:G01R31/50]]
[[Category:G01R31/52]]
[[Category:G01R31/54]]
[[Category:G01R31/69]]
[[Category:G06F11/22]]
[[Category:CPC_G01R31/3277]]