View source for 18728289. Abnormality Diagnosis Device and Method Thereof (Hitachi, Ltd.)

=Abnormality Diagnosis Device and Method Thereof=


==Organization Name==

[[:Category:Hitachi, Ltd.|Hitachi, Ltd.]]


[[Category:Hitachi, Ltd.]]

==Inventor(s)==

[[:Category:Shuichi Nishino of Tokyo JP|Shuichi Nishino of Tokyo JP]][[Category:Shuichi Nishino of Tokyo JP]]

[[:Category:Kenichi Shimbo of Tokyo JP|Kenichi Shimbo of Tokyo JP]][[Category:Kenichi Shimbo of Tokyo JP]]

[[:Category:Yutaka Uematsu of Tokyo JP|Yutaka Uematsu of Tokyo JP]][[Category:Yutaka Uematsu of Tokyo JP]]

==Abnormality Diagnosis Device and Method Thereof==


This abstract first appeared for US patent application 18728289 titled 'Abnormality Diagnosis Device and Method Thereof

==Original Abstract Submitted==

In an abnormality diagnosis device which estimates an abnormality degree, an abnormality factor, and the like of a target from data, a description of a diagnosis reason is presented in association with diagnosis knowledge of an operator, so that the operator can easily understand the description presentation. Therefore, the abnormality diagnosis device includes an abnormality diagnosis unit which diagnoses an abnormality of a diagnosis target using data related to the diagnosis target as an input, a description presentation unit which presents a description corresponding to the abnormality of the diagnosis target based on a result of diagnosis by the abnormality diagnosis unit, and a display unit which displays the description corresponding to the abnormality of the diagnosis target presented by the description presentation unit on a screen.



[[Category:G05B23/02]]
[[Category:CPC_G05B23/0243]]