View source for 18600289. PARTICLE BEAM MICROSCOPE simplified abstract (Carl Zeiss Microscopy GmbH)

=PARTICLE BEAM MICROSCOPE=


==Organization Name==

[[:Category:Carl Zeiss Microscopy GmbH|Carl Zeiss Microscopy GmbH]]


[[Category:Carl Zeiss Microscopy GmbH]]

==Inventor(s)==

[[:Category:Erik Essers of Aalen (DE)|Erik Essers of Aalen (DE)]][[Category:Erik Essers of Aalen (DE)]]

==PARTICLE BEAM MICROSCOPE - A simplified explanation of the abstract==


This abstract first appeared for US patent application 18600289 titled 'PARTICLE BEAM MICROSCOPE

'''Simplified Explanation''': 

The patent application describes a particle beam microscope that utilizes two scintillators to generate light with different spectral distributions, which overlap to enhance imaging capabilities.

* The particle beam microscope includes a particle beam source, an objective lens, a first scintillator, a second scintillator, and a light detector.
* The first scintillator generates light with a first spectral distribution, while the second scintillator generates light with a different second spectral distribution.
* The overlapping beam paths of light from the two scintillators improve the imaging quality of the microscope.

'''Key Features and Innovation''':

* Utilization of two scintillators with different spectral distributions.
* Overlapping beam paths of light for enhanced imaging capabilities.
* Improved imaging quality in a particle beam microscope.

'''Potential Applications''':

* Material analysis in research laboratories.
* Biological imaging in medical research.
* Semiconductor inspection in manufacturing processes.

'''Problems Solved''':

* Enhanced imaging resolution.
* Improved contrast in microscopic images.
* Better differentiation of materials or structures.

'''Benefits''':

* Higher quality imaging results.
* Increased accuracy in material analysis.
* Enhanced visualization of microscopic details.

'''Commercial Applications''''':

Particle Beam Microscope Technology for Advanced Material Analysis and Biological Imaging

'''Questions about Particle Beam Microscope Technology''':

1. How does the use of two scintillators with different spectral distributions improve imaging quality in a particle beam microscope?
2. What are the potential commercial applications of this technology in various industries?


==Original Abstract Submitted==

A particle beam microscope comprises a particle beam source, an objective lens, a first scintillator, a second scintillator, and a light detector. A first beam path of light generated by the first scintillator and a second beam path of light generated by the second scintillator overlap one another. A scintillator body of the first scintillator generates light having a first spectral distribution. The second scintillator generates light having a second spectral distribution, which is different from the first spectral distribution.



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