View source for 18595526. SEMICONDUCTOR APPARATUS, IMAGE CAPTURING APPARATUS, IMAGE CAPTURING SYSTEM, AND MOVING OBJECT simplified abstract (CANON KABUSHIKI KAISHA)

=SEMICONDUCTOR APPARATUS, IMAGE CAPTURING APPARATUS, IMAGE CAPTURING SYSTEM, AND MOVING OBJECT=


==Organization Name==

[[:Category:CANON KABUSHIKI KAISHA|CANON KABUSHIKI KAISHA]]


[[Category:CANON KABUSHIKI KAISHA]]

==Inventor(s)==

[[:Category:KEI Ochiai of Inagi-shi (JP)|KEI Ochiai of Inagi-shi (JP)]][[Category:KEI Ochiai of Inagi-shi (JP)]]

==SEMICONDUCTOR APPARATUS, IMAGE CAPTURING APPARATUS, IMAGE CAPTURING SYSTEM, AND MOVING OBJECT - A simplified explanation of the abstract==


This abstract first appeared for US patent application 18595526 titled 'SEMICONDUCTOR APPARATUS, IMAGE CAPTURING APPARATUS, IMAGE CAPTURING SYSTEM, AND MOVING OBJECT

The semiconductor apparatus described in the abstract includes a semiconductor device for signal processing, a driving control unit, and a lifetime obtaining unit.

* The driving control unit adjusts the drive of the semiconductor device based on the remaining lifetime information obtained by the lifetime obtaining unit.
* If the remaining lifetime information indicates a longer remaining lifetime, the semiconductor device is driven in a high-performance condition.
* In contrast, if the remaining lifetime information indicates a shorter remaining lifetime, the semiconductor device is driven in a lower throughput condition to extend its lifespan.

Potential Applications:
- This technology can be applied in various semiconductor devices such as processors, memory units, and communication modules.
- It can be used in industrial automation systems, automotive electronics, and consumer electronics for efficient performance management.

Problems Solved:
- Extends the lifespan of semiconductor devices by adjusting their performance based on remaining lifetime information.
- Optimizes the operation of semiconductor devices to prevent premature failure and improve overall reliability.

Benefits:
- Increases the longevity of semiconductor devices, reducing the need for frequent replacements.
- Enhances the efficiency and reliability of signal processing in various electronic systems.
- Reduces maintenance costs and downtime associated with semiconductor device failures.

Commercial Applications:
Title: "Smart Performance Management System for Semiconductor Devices"
This technology can be utilized in the manufacturing industry to improve the performance and longevity of machinery and equipment. It can also be integrated into IoT devices for enhanced data processing capabilities.

Questions about the technology:
1. How does the driving control unit determine the appropriate condition to drive the semiconductor device?
- The driving control unit analyzes the remaining lifetime information obtained by the lifetime obtaining unit to make this determination.

2. What are the potential implications of driving the semiconductor device in a lower throughput condition?
- Driving the semiconductor device in a lower throughput condition can help extend its remaining lifetime and prevent premature failure.


==Original Abstract Submitted==

A semiconductor apparatus includes a semiconductor device that performs signal processing, a driving control unit that controls drive of the semiconductor device, and a lifetime obtaining unit that obtains remaining lifetime information that represents a remaining lifetime of the semiconductor device. In a case where the remaining lifetime information represents a first length, the driving control unit drives the semiconductor device in a first condition. In a case where the remaining lifetime information represents a second length shorter than the first length, the driving control unit drives the semiconductor device in a second condition in which throughput of the signal processing is lower than that in a case where the semiconductor device is driven in the first condition, and the remaining lifetime of the semiconductor device is longer than that in the case where the semiconductor device is driven in the first condition.



[[Category:G01R31/26]]
[[Category:B60K35/00]]
[[Category:H01L27/146]]
[[Category:CPC_G01R31/2642]]