View source for 18582764. METHOD AND KIT FOR GENETIC ANALYSIS (Hitachi, Ltd.)

=METHOD AND KIT FOR GENETIC ANALYSIS=


==Organization Name==

[[:Category:Hitachi, Ltd.|Hitachi, Ltd.]]


[[Category:Hitachi, Ltd.]]

==Inventor(s)==

[[:Category:Junko Tanaka of Tokyo (JP)|Junko Tanaka of Tokyo (JP)]][[Category:Junko Tanaka of Tokyo (JP)]]

[[:Category:Tatsuo Nakagawa of Tokyo (JP)|Tatsuo Nakagawa of Tokyo (JP)]][[Category:Tatsuo Nakagawa of Tokyo (JP)]]

==METHOD AND KIT FOR GENETIC ANALYSIS==


This abstract first appeared for US patent application 18582764 titled 'METHOD AND KIT FOR GENETIC ANALYSIS




==Original Abstract Submitted==

A method and kit for genetic analysis can accurately determine whether a plurality of genetic mutations in close proximity are present in a positional relationship of a cis-form or a trans-form and quantify the genetic mutations. The method for genetic analysis includes: preparing probes corresponding to each of a plurality of genetic mutations; performing an amplification reaction using a solution comprising a primer for amplifying a region comprising the plurality of genetic mutations, the probes, a test biological sample, and an enzyme; measuring a binding of an amplicon to the probe by melting curve analysis at varying temperatures of the solution after performing the amplification reaction; and determining, based on a result of the melting curve analysis, whether the plurality of genetic mutations are on a same allele in a cis form or on different alleles in a trans form in DNA contained in the test biological sample.



[[Category:C12Q1/6827]]
[[Category:C12Q1/6806]]
[[Category:C12Q1/686]]
[[Category:C12Q1/6876]]
[[Category:G16B20/20]]
[[Category:G16B20/50]]
[[Category:CPC_C12Q1/6827]]