View source for 18539141. APPARATUSES, SYSTEMS, AND METHODS FOR SCREENING ELECTRONIC COMPONENTS simplified abstract (Schneider Electric USA, Inc.)

=APPARATUSES, SYSTEMS, AND METHODS FOR SCREENING ELECTRONIC COMPONENTS=


==Organization Name==

[[:Category:Schneider Electric USA, Inc.|Schneider Electric USA, Inc.]]


[[Category:Schneider Electric USA, Inc.]]

==Inventor(s)==

[[:Category:Juan Ignacio Melecio Ramirez of North Liberty IA (US)|Juan Ignacio Melecio Ramirez of North Liberty IA (US)]][[Category:Juan Ignacio Melecio Ramirez of North Liberty IA (US)]]

[[:Category:Collin Richard Fischels of Independence IA (US)|Collin Richard Fischels of Independence IA (US)]][[Category:Collin Richard Fischels of Independence IA (US)]]

[[:Category:Kenneth Riehl of North Liberty IA (US)|Kenneth Riehl of North Liberty IA (US)]][[Category:Kenneth Riehl of North Liberty IA (US)]]

[[:Category:Jeremy D. Schroeder of Cedar Rapids IA (US)|Jeremy D. Schroeder of Cedar Rapids IA (US)]][[Category:Jeremy D. Schroeder of Cedar Rapids IA (US)]]

==APPARATUSES, SYSTEMS, AND METHODS FOR SCREENING ELECTRONIC COMPONENTS - A simplified explanation of the abstract==


This abstract first appeared for US patent application 18539141 titled 'APPARATUSES, SYSTEMS, AND METHODS FOR SCREENING ELECTRONIC COMPONENTS

The patent application describes a system that includes a device under test, a body with multiple conductors, a rotation section, a probe connected to the rotation section, a nest with at least one terminal, and an opening in the device under test for the probe to pass through.

* The system involves a device under test, a body with multiple conductors, a rotation section, a probe, and a nest with at least one terminal.
* The probe is designed to house some of the conductors and can pass through an opening in the device under test.
* The nest is configured to connect to the device under test and allow the probe to pass through the opening.
* This system enables testing and analysis of the device under test without interference from the conductors.
* The design allows for efficient and accurate testing procedures.

Potential Applications:
* Quality control testing in manufacturing processes.
* Circuit testing in electronic devices.
* Research and development in various industries.

Problems Solved:
* Interference from conductors during testing.
* Inefficient testing procedures.
* Lack of accurate data collection.

Benefits:
* Improved testing accuracy.
* Enhanced efficiency in testing processes.
* Reduced risk of errors in data collection.

Commercial Applications:
* Manufacturing quality control systems.
* Electronic device testing equipment.
* Research and development tools for various industries.

Questions about the technology:
1. How does the system ensure accurate data collection during testing?
2. What industries can benefit the most from this testing system?


==Original Abstract Submitted==

A system may include a device under test, a body having a plurality of conductors, a rotation section, a probe associated with the rotation section, the probe configured to house at least a portion of one or more of the plurality of conductors, and a nest having at least one terminal, the nest configured to couple to the device under test and to permit at least a portion of the probe to pass through an opening of the device under test.



[[Category:G01R31/62]]
[[Category:G01R1/04]]
[[Category:G01R31/52]]
[[Category:CPC_G01R31/62]]