View source for 18532896. FUNCTIONAL TESTING METHOD (Inventec (Pudong) Technology Corporation)

=FUNCTIONAL TESTING METHOD=


==Organization Name==

[[:Category:Inventec (Pudong) Technology Corporation|Inventec (Pudong) Technology Corporation]]


[[Category:Inventec (Pudong) Technology Corporation]]

==Inventor(s)==

[[:Category:Chih-Jen Chin of Taipei City (TW)|Chih-Jen Chin of Taipei City (TW)]][[Category:Chih-Jen Chin of Taipei City (TW)]]

[[:Category:Cheng-Hung Wu of Taipei City (TW)|Cheng-Hung Wu of Taipei City (TW)]][[Category:Cheng-Hung Wu of Taipei City (TW)]]

[[:Category:Yi-Ping Yang of Taipei City (TW)|Yi-Ping Yang of Taipei City (TW)]][[Category:Yi-Ping Yang of Taipei City (TW)]]

==FUNCTIONAL TESTING METHOD==


This abstract first appeared for US patent application 18532896 titled 'FUNCTIONAL TESTING METHOD

==Original Abstract Submitted==

A functional testing method, adapted to a device under test, includes, by a main control chip, performing: requesting a test script according to identification information of the device under test from a database server, wherein the test script comprises a plurality of testing items of different types, and testing the device under test according to the test script.



[[Category:G06F11/27]]
[[Category:CPC_G06F11/27]]