View source for 18507387. MEMORY READ VOLTAGE THRESHOLD TRACKING BASED ON MEMORY DEVICE-ORIGINATED METRICS CHARACTERIZING VOLTAGE DISTRIBUTIONS simplified abstract (Micron Technology, Inc.)

=MEMORY READ VOLTAGE THRESHOLD TRACKING BASED ON MEMORY DEVICE-ORIGINATED METRICS CHARACTERIZING VOLTAGE DISTRIBUTIONS=


==Organization Name==

[[:Category:Micron Technology, Inc.|Micron Technology, Inc.]]


[[Category:Micron Technology, Inc.]]

==Inventor(s)==

[[:Category:Shantilal Rayshi Doru of San Diego CA (US)|Shantilal Rayshi Doru of San Diego CA (US)]][[Category:Shantilal Rayshi Doru of San Diego CA (US)]]

[[:Category:Patrick R. Khayat of San Diego CA (US)|Patrick R. Khayat of San Diego CA (US)]][[Category:Patrick R. Khayat of San Diego CA (US)]]

[[:Category:Steven Michael Kientz of Westminster CO (US)|Steven Michael Kientz of Westminster CO (US)]][[Category:Steven Michael Kientz of Westminster CO (US)]]

[[:Category:Sampath K. Ratnam of San Jose CA (US)|Sampath K. Ratnam of San Jose CA (US)]][[Category:Sampath K. Ratnam of San Jose CA (US)]]

[[:Category:Dung Viet Nguyen of San Jose CA (US)|Dung Viet Nguyen of San Jose CA (US)]][[Category:Dung Viet Nguyen of San Jose CA (US)]]

==MEMORY READ VOLTAGE THRESHOLD TRACKING BASED ON MEMORY DEVICE-ORIGINATED METRICS CHARACTERIZING VOLTAGE DISTRIBUTIONS - A simplified explanation of the abstract==


This abstract first appeared for US patent application 18507387 titled 'MEMORY READ VOLTAGE THRESHOLD TRACKING BASED ON MEMORY DEVICE-ORIGINATED METRICS CHARACTERIZING VOLTAGE DISTRIBUTIONS

==Simplified Explanation==

The patent application describes systems and methods for memory read threshold tracking based on voltage distributions in memory cells. 

* Memory device tracks voltage distributions in memory cells
* Controller adjusts voltage threshold values based on received metrics
* Adjusted threshold values used for reading memory cells

== Potential Applications ==
This technology could be applied in:
* Solid-state drives
* Embedded systems
* Mobile devices

== Problems Solved ==
This technology helps in:
* Improving memory read accuracy
* Enhancing memory cell performance

== Benefits ==
The benefits of this technology include:
* Increased data reliability
* Enhanced memory device lifespan

== Potential Commercial Applications ==
The potential commercial applications of this technology include:
* Memory device manufacturing
* Data storage industry

== Possible Prior Art ==
One possible prior art related to this technology is:
* Memory read threshold tracking based on temperature variations

=== Unanswered Questions ===

=== How does this technology impact memory device speed? ===
This technology can potentially improve memory device speed by optimizing voltage threshold values for memory cell read operations.

=== What are the potential cost implications of implementing this technology? ===
The cost implications of implementing this technology may include additional manufacturing costs for memory devices with advanced tracking capabilities.


==Original Abstract Submitted==

Described are systems and methods for memory read threshold tracking based on memory device-originated metrics characterizing voltage distributions. An example memory device includes: a memory array having a plurality of memory cells and a controller coupled to the memory array. The controller is to perform operations including: receiving a first value of a metric characterizing threshold voltage distributions of a subset of a set of the plurality of memory cells; determining a first voltage threshold adjustment value; receiving a second value of the metric; determining a second voltage threshold adjustment value; and applying the second voltage threshold adjustment value for reading the set of the plurality of memory cells.



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