View source for 18504316. APPARATUSES AND METHODS FOR CONFIGURABLE ECC MODES simplified abstract (Micron Technology, Inc.)

=APPARATUSES AND METHODS FOR CONFIGURABLE ECC MODES=


==Organization Name==

[[:Category:Micron Technology, Inc.|Micron Technology, Inc.]]


[[Category:Micron Technology, Inc.]]

==Inventor(s)==

[[:Category:Sujeet Ayyapureddi of Boise ID (US)|Sujeet Ayyapureddi of Boise ID (US)]][[Category:Sujeet Ayyapureddi of Boise ID (US)]]

[[:Category:Scott E. Smith of Boise ID (US)|Scott E. Smith of Boise ID (US)]][[Category:Scott E. Smith of Boise ID (US)]]

==APPARATUSES AND METHODS FOR CONFIGURABLE ECC MODES - A simplified explanation of the abstract==


This abstract first appeared for US patent application 18504316 titled 'APPARATUSES AND METHODS FOR CONFIGURABLE ECC MODES

==Simplified Explanation==

The patent application describes an enhanced ECC mode for a memory device, where data is stored in a subset of data column planes and corresponding parity data is stored in a separate column plane.

* Memory array includes data column planes and an extra column plane
* Data is stored in a subset of data column planes
* Parity data is stored in a column plane other than the subset or the extra column plane
* Capable of single error correction or SECDED depending on mode selected

== Potential Applications ==
This technology could be applied in:
* Data storage systems
* Error correction systems
* Memory devices

== Problems Solved ==
This technology addresses issues related to:
* Data corruption
* Error detection and correction
* Data integrity in memory systems

== Benefits ==
The benefits of this technology include:
* Enhanced error correction capabilities
* Improved data reliability
* Increased data integrity

== Potential Commercial Applications ==
Potential commercial applications of this technology include:
* Solid-state drives
* Servers
* Embedded systems

== Possible Prior Art ==
One possible prior art for this technology could be:
* Existing ECC modes in memory devices

== Unanswered Questions ==

=== How does this technology compare to existing ECC modes in terms of performance and reliability? ===
This article does not provide a direct comparison between this enhanced ECC mode and existing ECC modes.

=== Are there any potential drawbacks or limitations to implementing this enhanced ECC mode in memory devices? ===
The article does not discuss any potential drawbacks or limitations of implementing this enhanced ECC mode.


==Original Abstract Submitted==

Apparatuses, systems, and methods for an enhanced ECC mode. The memory array includes a number of data column planes and an extra column plane. When the memory device is set in an Enhanced ECC mode, data is stored in a subset of the data column planes, and an error correction code circuit (ECC) stores corresponding parity data in one of a column plane other than one of the subset of data column planes or the extra column plane. In this manner, memory may be capable of performing single error correction or single error correction with double error detection (SECDED) depending on the mode selected.



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