View source for 18494423. METHODS OF MEASUREMENT IN SDT simplified abstract (Apple Inc.)

=METHODS OF MEASUREMENT IN SDT=


==Organization Name==

[[:Category:Apple Inc.|Apple Inc.]]


[[Category:Apple Inc.]]

==Inventor(s)==

[[:Category:Fangli Xu of Beijing (CN)|Fangli Xu of Beijing (CN)]][[Category:Fangli Xu of Beijing (CN)]]

[[:Category:Dawei Zhang of Saratoga CA (US)|Dawei Zhang of Saratoga CA (US)]][[Category:Dawei Zhang of Saratoga CA (US)]]

[[:Category:Haijing Hu of Los Gatos CA (US)|Haijing Hu of Los Gatos CA (US)]][[Category:Haijing Hu of Los Gatos CA (US)]]

[[:Category:Naveen Kumar R Palle Venkata of San Diego CA (US)|Naveen Kumar R Palle Venkata of San Diego CA (US)]][[Category:Naveen Kumar R Palle Venkata of San Diego CA (US)]]

[[:Category:Ralf Rossbach of Munich (DE)|Ralf Rossbach of Munich (DE)]][[Category:Ralf Rossbach of Munich (DE)]]

[[:Category:Sarma V. Vangala of Campbell CA (US)|Sarma V. Vangala of Campbell CA (US)]][[Category:Sarma V. Vangala of Campbell CA (US)]]

[[:Category:Sethuraman Gurumoorthy of San Ramon CA (US)|Sethuraman Gurumoorthy of San Ramon CA (US)]][[Category:Sethuraman Gurumoorthy of San Ramon CA (US)]]

[[:Category:Srirang A. Lovlekar of Fremont CA (US)|Srirang A. Lovlekar of Fremont CA (US)]][[Category:Srirang A. Lovlekar of Fremont CA (US)]]

[[:Category:Yuqin Chen of Beijing (CN)|Yuqin Chen of Beijing (CN)]][[Category:Yuqin Chen of Beijing (CN)]]

[[:Category:Zhibin Wu of Los Altos CA (US)|Zhibin Wu of Los Altos CA (US)]][[Category:Zhibin Wu of Los Altos CA (US)]]

==METHODS OF MEASUREMENT IN SDT - A simplified explanation of the abstract==


This abstract first appeared for US patent application 18494423 titled 'METHODS OF MEASUREMENT IN SDT

==Simplified Explanation==

The abstract describes systems and methods for measuring cells during a Small Data Transmission (SDT) procedure when a User Equipment (UE) is in a Radio Resource Control (RRC) INACTIVE state. Measurements taken during the SDT procedure can determine cell qualities and be used for monitoring and reporting to the network.

* Measurements of cells taken during an SDT procedure when UE is in RRC INACTIVE state
* Determine cell qualities using beam and/or cell measurements
* Monitor for measurement events during SDT measurement period
* Send measurement reports to network based on cell qualities
* Send messaging to induce network to change RRC state of UE

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### Potential Applications
* Mobile telecommunications networks
* Internet of Things (IoT) devices
* Smart city infrastructure

### Problems Solved
* Efficient monitoring and reporting of cell qualities during SDT procedures
* Optimization of network resources based on UE measurements

### Benefits
* Improved network performance
* Enhanced user experience
* Resource optimization in telecommunications networks


==Original Abstract Submitted==

Systems and methods for performing measurements of one or more cells during an small data transmission (SDT) procedure between a user equipment (UE) and a network when the UE is in a radio resource control (RRC) INACTIVE state are described herein. Beam and/or cell measurements taken during an SDT measurement period of the SDT procedure may be used to determine one or more respective cell qualities, among other possibilities. Beginnings and endings of the SDT measurement period, and the manner (timing) for taking measurements within the SDT measurement period, are also described. The cell qualities so determined can then be used to monitor, during the SDT measurement period, for a measurement event, which causes the UE to send a measurement report to the network having data determined using those cell qualities, and/or to send messaging intended to induce the network to change the RRC state of the UE.



[[Category:H04W24/10]]
[[Category:H04W76/28]]
[[Category:H04W74/08]]