View source for 18388623. DEFECT CHARACTERIZATION IN SEMICONDUCTOR DEVICES BASED ON IMAGE PROCESSING simplified abstract (Micron Technology, Inc.)

=DEFECT CHARACTERIZATION IN SEMICONDUCTOR DEVICES BASED ON IMAGE PROCESSING=


==Organization Name==

[[:Category:Micron Technology, Inc.|Micron Technology, Inc.]]


[[Category:Micron Technology, Inc.]]

==Inventor(s)==

[[:Category:Nagasubramaniyan Chandrasekaran of Eagle ID (US)|Nagasubramaniyan Chandrasekaran of Eagle ID (US)]][[Category:Nagasubramaniyan Chandrasekaran of Eagle ID (US)]]

==DEFECT CHARACTERIZATION IN SEMICONDUCTOR DEVICES BASED ON IMAGE PROCESSING - A simplified explanation of the abstract==


This abstract first appeared for US patent application 18388623 titled 'DEFECT CHARACTERIZATION IN SEMICONDUCTOR DEVICES BASED ON IMAGE PROCESSING

==Simplified Explanation==

The system described in the patent application is designed to analyze images of electronic device substrates to identify regions of interest corresponding to electronic circuits. Here is a simplified explanation of the patent application:

* The system receives an image of an electronic device substrate.
* It extracts visual features from the image using a feature extraction model.
* The system then identifies a region of interest corresponding to an electronic circuit associated with the device's performance using a trainable feature classifier.

Potential Applications:
This technology could be used in quality control processes for electronic devices, helping to identify and analyze specific components on circuit boards.

Problems Solved:
This system streamlines the process of identifying and analyzing electronic circuits on device substrates, improving efficiency and accuracy in quality control procedures.

Benefits:
The technology can help manufacturers ensure the quality and performance of electronic devices by quickly and accurately identifying key components on circuit boards.

Potential Commercial Applications of this Technology:
"Enhancing Quality Control Processes for Electronic Devices with Image Analysis Technology"

Possible Prior Art:
One possible prior art could be image recognition software used in quality control processes for electronic devices, but the specific combination of feature extraction and trainable feature classification for identifying regions of interest may be unique to this patent application.

Unanswered Questions:
1. How does the system handle variations in lighting and angles when analyzing images of electronic device substrates?
2. What is the processing time required for the system to extract visual features and identify regions of interest in an image?


==Original Abstract Submitted==

A system includes a memory and a processing device, operatively coupled with the memory, to perform operations including: receiving an image of a substrate of an electronic device; extracting, by a feature extraction model processing the image, a plurality of visual features from the image; and identifying, by a trainable feature classifier processing the plurality of visual features, a region of interest corresponding to an electronic circuit associated with performance of the electronic circuit.



[[Category:G06T7/00]]
[[Category:G06V10/25]]
[[Category:G06V10/40]]
[[Category:G06V10/764]]
[[Category:G06V10/77]]
[[Category:G06V10/774]]