View source for 18369601. MILLIMETER WAVE MODULE INSPECTION SYSTEM, MILLIMETER WAVE MODULE INSPECTION DEVICE, AND MILLIMETER WAVE MODULE INSPECTION METHOD simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)

=MILLIMETER WAVE MODULE INSPECTION SYSTEM, MILLIMETER WAVE MODULE INSPECTION DEVICE, AND MILLIMETER WAVE MODULE INSPECTION METHOD=


==Organization Name==

[[:Category:SAMSUNG ELECTRONICS CO., LTD.|SAMSUNG ELECTRONICS CO., LTD.]]


[[Category:SAMSUNG ELECTRONICS CO., LTD.]]

==Inventor(s)==

[[:Category:Namjun Cho of Suwon-si (KR)|Namjun Cho of Suwon-si (KR)]][[Category:Namjun Cho of Suwon-si (KR)]]

[[:Category:Sanghun Sim of Suwon-si (KR)|Sanghun Sim of Suwon-si (KR)]][[Category:Sanghun Sim of Suwon-si (KR)]]

==MILLIMETER WAVE MODULE INSPECTION SYSTEM, MILLIMETER WAVE MODULE INSPECTION DEVICE, AND MILLIMETER WAVE MODULE INSPECTION METHOD - A simplified explanation of the abstract==


This abstract first appeared for US patent application 18369601 titled 'MILLIMETER WAVE MODULE INSPECTION SYSTEM, MILLIMETER WAVE MODULE INSPECTION DEVICE, AND MILLIMETER WAVE MODULE INSPECTION METHOD

==Simplified Explanation==

The abstract describes a millimeter wave module inspection system that includes an electronic device with a processor and a millimeter wave module with a memory, antenna, and transceiver. The processor is configured to control the input signal to the millimeter wave module, identify the output signal from the module, and retrieve data related to transmission and reception chain gains stored in the memory. Based on the identified signals and data, the processor determines whether the millimeter wave module is abnormal.

* The system includes an electronic device with a processor and a millimeter wave module.
* The millimeter wave module consists of a memory, at least one antenna, and at least one transceiver.
* The processor controls the input signal to the millimeter wave module.
* The processor identifies the output signal from the millimeter wave module when the input signal passes through the antenna.
* The processor retrieves data related to transmission and reception chain gains stored in the memory.
* The processor determines whether the millimeter wave module is abnormal based on the identified signals and data.

Potential applications of this technology:
* Inspection and testing of millimeter wave modules in various industries such as telecommunications, aerospace, and automotive.
* Quality control and performance evaluation of millimeter wave modules during manufacturing processes.
* Troubleshooting and maintenance of millimeter wave communication systems.

Problems solved by this technology:
* Detection of abnormalities or malfunctions in millimeter wave modules.
* Identification of transmission and reception chain gains for accurate performance evaluation.
* Efficient and automated inspection of millimeter wave modules.

Benefits of this technology:
* Improved reliability and performance of millimeter wave modules.
* Reduced downtime and maintenance costs through early detection of abnormalities.
* Enhanced efficiency and accuracy in the inspection and testing processes.


==Original Abstract Submitted==

A millimeter wave module inspection system includes: an electronic device including at least one processor; and a millimeter wave module including a memory, at least one antenna, and at least one transceiver, wherein the at least one processor is configured to: control an input signal to be input to a transmission signal input terminal of the millimeter wave module; identify an output signal that is output from a reception signal output terminal of the millimeter wave module when the input signal passes through the at least one antenna of the millimeter wave module; identify first data corresponding to a transmission chain gain related to a transmission path of the millimeter wave module stored in the memory and second data corresponding to a reception chain gain related to a reception path of the millimeter wave module, the first data and the second data being stored in the memory; and determine whether the millimeter wave module is abnormal based at least on the identified output signal, the first data, and the second data.



[[Category:H04B17/19]]
[[Category:H04B1/38]]