View source for 18369014. ERROR CONDITION MONITORING IN MEMORY SYSTEMS (SK hynix Inc.)

=ERROR CONDITION MONITORING IN MEMORY SYSTEMS=


==Organization Name==

[[:Category:SK hynix Inc.|SK hynix Inc.]]


[[Category:SK hynix Inc.]]

==Inventor(s)==

[[:Category:Pengfei Huang of San Jose CA US|Pengfei Huang of San Jose CA US]][[Category:Pengfei Huang of San Jose CA US]]

[[:Category:Zion Kwok of Burnaby CA|Zion Kwok of Burnaby CA]][[Category:Zion Kwok of Burnaby CA]]

[[:Category:Fan Zhang of San Jose CA US|Fan Zhang of San Jose CA US]][[Category:Fan Zhang of San Jose CA US]]

==ERROR CONDITION MONITORING IN MEMORY SYSTEMS==


This abstract first appeared for US patent application 18369014 titled 'ERROR CONDITION MONITORING IN MEMORY SYSTEMS

==Original Abstract Submitted==

This application is directed to data validation in an electronic device having a memory device. The memory device receives an inquiry for a validity condition of a page of the memory device from a memory controller that is coupled to the memory device in a memory system. In response to the inquiry, the memory device selects a subset of the page of the memory device to represent the page. The subset of the page stores a set of memory data. The memory device obtains integrity data corresponding to the set of memory data, applies a plurality of validation operations on the set of memory data and the integrity data corresponding to the set of memory data to generate a plurality of validity results. The memory device determines an error parameter of the page locally based on the plurality of validity results and provides the error parameter to the memory controller.



[[Category:G11C29/52]]
[[Category:G11C7/14]]
[[Category:G11C29/00]]
[[Category:CPC_G11C29/52]]