View source for 18223465. MEMORY WITH FAIL INDICATORS, INCLUDING MEMORY WITH LED FAIL INDICATORS, AND ASSOCIATED SYSTEMS, DEVICES, AND METHODS simplified abstract (Micron Technology, Inc.)

=MEMORY WITH FAIL INDICATORS, INCLUDING MEMORY WITH LED FAIL INDICATORS, AND ASSOCIATED SYSTEMS, DEVICES, AND METHODS=


==Organization Name==

[[:Category:Micron Technology, Inc.|Micron Technology, Inc.]]


[[Category:Micron Technology, Inc.]]

==Inventor(s)==

[[:Category:Aaron Jannusch of Boise ID (US)|Aaron Jannusch of Boise ID (US)]][[Category:Aaron Jannusch of Boise ID (US)]]

[[:Category:Mow Yiak Goh of Boise ID (US)|Mow Yiak Goh of Boise ID (US)]][[Category:Mow Yiak Goh of Boise ID (US)]]

[[:Category:Robin K. Mitra of Buda TX (US)|Robin K. Mitra of Buda TX (US)]][[Category:Robin K. Mitra of Buda TX (US)]]

==MEMORY WITH FAIL INDICATORS, INCLUDING MEMORY WITH LED FAIL INDICATORS, AND ASSOCIATED SYSTEMS, DEVICES, AND METHODS - A simplified explanation of the abstract==


This abstract first appeared for US patent application 18223465 titled 'MEMORY WITH FAIL INDICATORS, INCLUDING MEMORY WITH LED FAIL INDICATORS, AND ASSOCIATED SYSTEMS, DEVICES, AND METHODS

==Simplified Explanation==

* Memory with fail indicators and associated systems, devices, and methods are disclosed in the patent application.
* The system includes multiple memory systems and a host device.
* At least one memory system has a fail indicator connected to the host device through a side channel.
* The host device can detect a failure on the memory system and activate the fail indicator.
* The side channel can be an I2C or I3C side channel.
* The fail indicator, when activated, can provide a visual indication of the failure, such as an LED emitting light.
* The color of the light can indicate the type, occurrence, or location of the failure on the memory system.

== Potential Applications ==
* Data storage systems
* Computer servers
* Embedded systems

== Problems Solved ==
* Quickly identifying memory failures
* Improving system reliability
* Enhancing fault detection and troubleshooting processes

== Benefits ==
* Early detection of memory failures
* Improved system maintenance
* Enhanced system performance and reliability


==Original Abstract Submitted==

Memory with fail indicators, and associated systems, devices, and methods are disclosed herein. In one embodiment, a system includes a plurality of memory systems and a host device. At least one of the memory systems includes a fail indicator connected to the host device via a side channel of the system. The host device is configured to detect an occurrence of a failure on the at least one memory system and to initiate activation of the fail indicator. The side channel can be an I2C or I3C side channel. The fail indicator, when activated, can provide a visual indication of the failure. For example, the fail indicator can include an LED that can be activated to emit light and provide an indication of the failure. A color of the light can correspond to a type, occurrence, or location of the failure on the at least one memory system.



[[Category:G06F11/07]]