View source for 18205418. DEVICE, METHOD, AND PROGRAM FOR DETECTING ABNORMAL POSITION simplified abstract (NEC Corporation)

=DEVICE, METHOD, AND PROGRAM FOR DETECTING ABNORMAL POSITION=


==Organization Name==

[[:Category:NEC Corporation|NEC Corporation]]


[[Category:NEC Corporation]]

==Inventor(s)==

[[:Category:Jiro Abe of Tokyo (JP)|Jiro Abe of Tokyo (JP)]][[Category:Jiro Abe of Tokyo (JP)]]

==DEVICE, METHOD, AND PROGRAM FOR DETECTING ABNORMAL POSITION - A simplified explanation of the abstract==


This abstract first appeared for US patent application 18205418 titled 'DEVICE, METHOD, AND PROGRAM FOR DETECTING ABNORMAL POSITION

==Simplified Explanation==

The technique described in the abstract involves a device that can identify abnormal changes in a surface or region of a subject using a distance measuring device.

* The device includes at least one processor that can extract abnormal parts of a surface based on reflection signals generated in response to signals emitted by different sections of the distance measuring device.
* The processor can then specify a region of the surface that includes the abnormal parts identified by multiple emitting sections.

== Potential Applications ==
This technology could be used in medical imaging to detect abnormalities in tissues or organs, in industrial inspections to identify defects in surfaces, and in security systems to recognize unauthorized changes in environments.

== Problems Solved ==
This technology solves the problem of efficiently identifying abnormal changes in surfaces or regions without the need for manual inspection, reducing the risk of human error and increasing the accuracy of detection.

== Benefits ==
The benefits of this technology include improved accuracy in identifying abnormalities, increased efficiency in detecting changes, and the potential for early detection of issues in various applications.

== Potential Commercial Applications ==
Potential commercial applications of this technology include medical imaging devices, industrial inspection systems, security surveillance systems, and quality control tools in manufacturing processes.

== Possible Prior Art ==
One possible prior art for this technology could be similar systems used in medical imaging for detecting abnormalities in tissues or organs. Another could be distance measuring devices used in industrial inspections for identifying defects in surfaces.

=== Unanswered Questions ===

=== How does this technology compare to existing methods of detecting abnormalities in surfaces or regions? ===
This article does not provide a direct comparison between this technology and existing methods, leaving the reader to wonder about the advantages and disadvantages of this innovation in relation to current practices.

=== What are the potential limitations or challenges in implementing this technology in real-world applications? ===
The article does not address any potential limitations or challenges that may arise when implementing this technology, leaving the reader curious about the practical considerations of using this innovation in different scenarios.


==Original Abstract Submitted==

Provided is a technique that specifies (a) a part actually having an abnormal change in surface or (b) a region including the part. The device includes at least one processor configured to: extract, on the basis of a reflection signal generated in response to a signal that one of a plurality of emitting sections included in a distance measuring device has emitted to a subject, a part of a surface of the subject which part has an abnormal change, the extracting being carried out for each of the plurality of emitting sections; and specify a region of the surface, the region including parts of the surface which parts have been extracted in relation to two or more of the plurality of emitting sections.



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