View source for 18115456. IMAGE PROCESSING DEVICE AND IMAGE PROCESSING METHOD simplified abstract (SK hynix Inc.)

=IMAGE PROCESSING DEVICE AND IMAGE PROCESSING METHOD=


==Organization Name==

[[:Category:SK hynix Inc.|SK hynix Inc.]]


[[Category:SK hynix Inc.]]

==Inventor(s)==

[[:Category:Woo Young Jeong of Icheon-si Gyeonggi-do (KR)|Woo Young Jeong of Icheon-si Gyeonggi-do (KR)]][[Category:Woo Young Jeong of Icheon-si Gyeonggi-do (KR)]]

[[:Category:Ja Min Koo of Icheon-si Gyeonggi-do (KR)|Ja Min Koo of Icheon-si Gyeonggi-do (KR)]][[Category:Ja Min Koo of Icheon-si Gyeonggi-do (KR)]]

[[:Category:Tae Hyun Kim of Icheon-si Gyeonggi-do (KR)|Tae Hyun Kim of Icheon-si Gyeonggi-do (KR)]][[Category:Tae Hyun Kim of Icheon-si Gyeonggi-do (KR)]]

[[:Category:Jae Hwan Jeon of Icheon-si Gyeonggi-do (KR)|Jae Hwan Jeon of Icheon-si Gyeonggi-do (KR)]][[Category:Jae Hwan Jeon of Icheon-si Gyeonggi-do (KR)]]

[[:Category:Chang Hun Cho of Icheon-si Gyeonggi-do (KR)|Chang Hun Cho of Icheon-si Gyeonggi-do (KR)]][[Category:Chang Hun Cho of Icheon-si Gyeonggi-do (KR)]]

==IMAGE PROCESSING DEVICE AND IMAGE PROCESSING METHOD - A simplified explanation of the abstract==


This abstract first appeared for US patent application 18115456 titled 'IMAGE PROCESSING DEVICE AND IMAGE PROCESSING METHOD

==Simplified Explanation==

The abstract describes an image processing device that identifies defect candidate pixels by analyzing phase information of pixels with respect to different modulation frequencies of a sensing light source. It then corrects the phase of the identified defect candidate pixels.

* Decision pixel manager sets a decision area for defect candidate pixels and determines first and second decision pixels based on phase information at different modulation frequencies.
* Target pixel determiner calculates the phase difference between the first and second decision pixels and identifies defect candidate pixels based on a predetermined reference value.
* Phase corrector adjusts the phase of the defect candidate pixels based on the phase difference.

== Potential Applications ==
This technology can be applied in various industries such as semiconductor manufacturing, quality control in production lines, and medical imaging for detecting anomalies in images.

== Problems Solved ==
1. Efficient identification of defect candidate pixels in images.
2. Accurate correction of phase information for improved image quality.

== Benefits ==
1. Enhanced image processing capabilities.
2. Increased accuracy in defect detection.
3. Improved quality control in manufacturing processes.

== Potential Commercial Applications ==
"Image Processing Device for Defect Detection and Correction" can be utilized in industries such as electronics manufacturing, automotive production, and medical imaging for quality control and anomaly detection.

== Possible Prior Art ==
One possible prior art could be the use of image processing algorithms for defect detection in manufacturing processes. However, the specific method of analyzing phase information at different modulation frequencies to identify and correct defect candidate pixels may be a novel aspect of this technology.

=== Unanswered Questions ===

=== How does this technology compare to existing defect detection systems in terms of accuracy and efficiency? ===
This article does not provide a direct comparison with existing defect detection systems, so it is unclear how this technology performs in comparison to traditional methods.

=== What are the potential limitations or challenges in implementing this technology in real-world applications? ===
The article does not address any potential limitations or challenges that may arise when implementing this technology in practical settings, leaving room for further exploration of these aspects.


==Original Abstract Submitted==

An image processing device including: a decision pixel manager for setting a decision area for a defect candidate pixel, and determining a first decision pixel and a second decision pixel, based on first phase information of pixels included in the decision area with respect to a first modulation frequency of a sensing light source among the pixels; a target pixel determiner for calculating a phase difference between the first decision pixel and the second decision pixel, based on second phase information of the pixels with respect to a second modulation frequency of the sensing light source, and determining the defect candidate pixel as a target pixel, corresponding to that the phase difference exceeds a predetermined reference value; and a phase corrector for changing a phase of the target pixel, based on the phase difference.



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