View source for 18105792. SYSTEMS AND METHODS OF TESTING DEVICES USING CXL FOR INCREASED PARALLELISM simplified abstract (ADVANTEST CORPORATION)

=SYSTEMS AND METHODS OF TESTING DEVICES USING CXL FOR INCREASED PARALLELISM=


==Organization Name==

[[:Category:ADVANTEST CORPORATION|ADVANTEST CORPORATION]]


[[Category:ADVANTEST CORPORATION]]

==Inventor(s)==

[[:Category:Edmundo De La Puente of San Jose CA (US)|Edmundo De La Puente of San Jose CA (US)]][[Category:Edmundo De La Puente of San Jose CA (US)]]

==SYSTEMS AND METHODS OF TESTING DEVICES USING CXL FOR INCREASED PARALLELISM - A simplified explanation of the abstract==


This abstract first appeared for US patent application 18105792 titled 'SYSTEMS AND METHODS OF TESTING DEVICES USING CXL FOR INCREASED PARALLELISM

==Simplified Explanation==

Embodiments of the present invention involve a system that can selectively enable 16 lane or 8 lane device testing using multiplexor circuitry between a CXL1.1 CPU and the devices under test (DUTs) during testing. This allows for improved parallelism and testing efficiency compared to existing methods that can only test devices using 8 lanes of the CXL 1.1 CPU.

* Selectively enable 16 lane or 8 lane device testing
* Use multiplexor circuitry between CXL1.1 CPU and DUTs
* Improve parallelism and testing efficiency
* Enhance testing capabilities compared to existing methods

== Potential Applications ==
This technology can be applied in various industries such as semiconductor testing, hardware development, and quality assurance processes.

== Problems Solved ==
1. Limited testing capabilities with existing methods
2. Inefficient use of CPU lanes during device testing

== Benefits ==
1. Improved parallelism
2. Enhanced testing efficiency
3. Increased flexibility in device testing

== Potential Commercial Applications ==
Optimizing CPU lane usage for device testing in semiconductor manufacturing

== Possible Prior Art ==
One possible prior art could be the use of multiplexor circuitry in testing systems, but the specific application of selectively enabling 16 or 8 lane device testing may be novel.

== Unanswered Questions ==
1. How does this technology impact the overall cost of device testing?
2. Are there any limitations to the types of devices that can be tested using this system?


==Original Abstract Submitted==

Embodiments of the present invention can selectively enable 16 lane (×16) or 8 lane (×8) device testing using multiplexor circuitry disposed between a CXL1.1 CPU and the DUTs during testing. In this way, parallelism and testing efficiency are significantly improved compared to existing approaches that can only test devices using 8 lanes of the CXL 1.1 CPU.



[[Category:G01R31/319]]