View source for 17992296. METHOD AND SYSTEM FOR OPTIMIZING SAMPLING IN SPOT TIME-OF-FLIGHT (TOF) SENSOR simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)

=METHOD AND SYSTEM FOR OPTIMIZING SAMPLING IN SPOT TIME-OF-FLIGHT (TOF) SENSOR=


==Organization Name==

[[:Category:SAMSUNG ELECTRONICS CO., LTD.|SAMSUNG ELECTRONICS CO., LTD.]]


[[Category:SAMSUNG ELECTRONICS CO., LTD.]]

==Inventor(s)==

[[:Category:Srenivas Varadarajan of Bengaluru (IN)|Srenivas Varadarajan of Bengaluru (IN)]][[Category:Srenivas Varadarajan of Bengaluru (IN)]]

[[:Category:Kaustav Chanda of Bengaluru (IN)|Kaustav Chanda of Bengaluru (IN)]][[Category:Kaustav Chanda of Bengaluru (IN)]]

[[:Category:Kwanghyuk Bae of Seoul (KR)|Kwanghyuk Bae of Seoul (KR)]][[Category:Kwanghyuk Bae of Seoul (KR)]]

[[:Category:Manish Goel of Bengaluru (IN)|Manish Goel of Bengaluru (IN)]][[Category:Manish Goel of Bengaluru (IN)]]

==METHOD AND SYSTEM FOR OPTIMIZING SAMPLING IN SPOT TIME-OF-FLIGHT (TOF) SENSOR - A simplified explanation of the abstract==


This abstract first appeared for US patent application 17992296 titled 'METHOD AND SYSTEM FOR OPTIMIZING SAMPLING IN SPOT TIME-OF-FLIGHT (TOF) SENSOR

==Simplified Explanation==

The abstract describes a method for optimizing sampling in a spot Time-of-Flight (ToF) sensor. The method involves analyzing an image of a scene, dividing it into rectangular regions based on edge features, computing an edge region alignment for each region using Histogram of oriented Gradients (HoG) distribution, re-projecting ToF data onto a Complementary Metal Oxide Semiconductor (CMOS) Image Sensor (CIS) image plane, sampling rectangular regions based on regional depth variance, and reconfiguring the illumination pattern for the spot ToF sensor image frame using the sampled regions.

* The method optimizes sampling in a spot Time-of-Flight (ToF) sensor.
* The image of a scene is divided into rectangular regions based on edge features.
* Edge region alignment is computed for each rectangular region using Histogram of oriented Gradients (HoG) distribution.
* ToF data is re-projected onto a Complementary Metal Oxide Semiconductor (CMOS) Image Sensor (CIS) image plane.
* Rectangular regions are sampled based on regional depth variance compared to a threshold depth variance.
* The illumination pattern for the spot ToF sensor image frame is reconfigured using the sampled rectangular regions.

==Potential Applications==
* Time-of-Flight (ToF) sensors in various industries such as robotics, autonomous vehicles, and surveillance systems.
* Depth sensing and 3D imaging applications.
* Augmented reality and virtual reality systems.
* Gesture recognition and human-computer interaction technologies.

==Problems Solved==
* Optimizes sampling in a spot Time-of-Flight (ToF) sensor, improving the accuracy and efficiency of depth sensing.
* Provides a method for selecting rectangular regions based on edge features and regional depth variance, reducing the amount of data to be processed.
* Enables reconfiguration of the illumination pattern for better image quality and depth estimation.

==Benefits==
* Improved accuracy and efficiency in depth sensing.
* Reduced computational load by sampling selected rectangular regions.
* Enhanced image quality and depth estimation through reconfigured illumination pattern.
* Potential for cost-effective implementation in various applications.


==Original Abstract Submitted==

A method for optimizing sampling in a spot Time-of-Flight (ToF) sensor includes receiving an image of a scene, dividing the image into plural rectangular regions, based on an edge feature in the image, computing an edge region alignment for each rectangular region by analyzing a Histogram of oriented Gradients (HoG) distribution corresponding to the rectangular region, re-projecting ToF data on a Complementary Metal Oxide Semiconductor (CMOS) Image Sensor (CIS) image plane according to the edge region alignment, sampling one or more rectangular regions from among the plural rectangular regions by comparing a regional depth variance of each rectangular region with a threshold depth variance, and reconfiguring an illumination pattern for a spot ToF sensor image frame using the one or more rectangular regions that are sampled.



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[[Category:G01S17/894]]
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[[Category:G06T7/521]]