View source for 17898446. Compliant Probes Including Dual Independently Operable Probe Contact Elements Including At Least One Flat Extension Spring, Methods for Making, and Methods for Using simplified abstract (Microfabrica Inc.)

=Compliant Probes Including Dual Independently Operable Probe Contact Elements Including At Least One Flat Extension Spring, Methods for Making, and Methods for Using=


==Organization Name==

[[:Category:Microfabrica Inc.|Microfabrica Inc.]]


[[Category:Microfabrica Inc.]]

==Inventor(s)==

[[:Category:Ming Ting Wu of San Jose CA (US)|Ming Ting Wu of San Jose CA (US)]][[Category:Ming Ting Wu of San Jose CA (US)]]

[[:Category:Garret R. Smalley of Newhall CA (US)|Garret R. Smalley of Newhall CA (US)]][[Category:Garret R. Smalley of Newhall CA (US)]]

==Compliant Probes Including Dual Independently Operable Probe Contact Elements Including At Least One Flat Extension Spring, Methods for Making, and Methods for Using - A simplified explanation of the abstract==


This abstract first appeared for US patent application 17898446 titled 'Compliant Probes Including Dual Independently Operable Probe Contact Elements Including At Least One Flat Extension Spring, Methods for Making, and Methods for Using

==Simplified Explanation==

The patent application describes probe structures and arrays that include flat tensional spring segments, narrowed channel passage segments, and pairs of joined probes with compressible tips. These features enhance stability, pointing accuracy, and allow for assembled formation of movable probe elements.

* Flat tensional spring segments in probes and arrays
* Narrowed channel passage segments to enhance stability and pointing accuracy
* Pairs of joined probes with compressible tips for Kelvin probe tests

== Potential Applications ==
The technology described in the patent application could be used in various fields such as nanotechnology, electronics testing, and materials science.

== Problems Solved ==
The technology addresses issues related to stability, accuracy, and flexibility in probe structures and arrays.

== Benefits ==
The benefits of this technology include improved performance, increased precision, and enhanced functionality in probe-based applications.

== Potential Commercial Applications ==
Potential commercial applications of this technology could include manufacturing of high-precision testing equipment, development of advanced research tools, and integration into semiconductor fabrication processes.

== Possible Prior Art ==
One possible prior art could be the use of tensional spring segments in probe structures, but the specific combination of features described in the patent application may be novel.

=== Unanswered Questions ===

=== How does this technology compare to existing probe structures in terms of cost-effectiveness? ===
The cost-effectiveness of implementing this technology compared to traditional probe structures is not addressed in the patent application. Further research and analysis would be needed to determine the economic viability of adopting this innovation.

=== What are the potential limitations or drawbacks of using probes with compressible tips? ===
The potential limitations or drawbacks of using probes with compressible tips, such as durability, sensitivity to environmental conditions, or compatibility with different testing environments, are not discussed in the patent application. Additional testing and evaluation would be necessary to assess these factors.


==Original Abstract Submitted==

Probe structures, arrays, methods of using probes and arrays, and/or methods for making probes and/or arrays wherein the probes include at least one flat tensional spring segments and in some embodiments include one or both of:(1) narrowed channel passage segments (e.g. by increasing width of plunger elements or by decreasing channel widths) along portions of channel lengths (e.g. not entire channel lengths) to enhance stability or pointing accuracy while still allowing for assembled formation of movable probe elements and/or (2) pairs of joined probes with at least one end of the probe set having independently compressible tips (e.g. as Kelvin probe pairs for use in 4 wire Kelvin probe tests).



[[Category:G01R1/067]]
[[Category:G01R1/073]]
[[Category:G01R3/00]]