View source for 17846397. METHOD FOR MEASURING QUIESCENT CURRENT IN A SWITCHING VOLTAGE REGULATOR simplified abstract (Texas Instruments Incorporated)

=METHOD FOR MEASURING QUIESCENT CURRENT IN A SWITCHING VOLTAGE REGULATOR=


==Organization Name==

[[:Category:Texas Instruments Incorporated|Texas Instruments Incorporated]]


[[Category:Texas Instruments Incorporated]]

==Inventor(s)==

[[:Category:HARSH Patel of Bangalore (IN)|HARSH Patel of Bangalore (IN)]][[Category:HARSH Patel of Bangalore (IN)]]

[[:Category:Aalok Dyuti Saha of Bangalore (IN)|Aalok Dyuti Saha of Bangalore (IN)]][[Category:Aalok Dyuti Saha of Bangalore (IN)]]

[[:Category:Sanjeev Praphulla Chandra Nyshadham of Bangalore (IN)|Sanjeev Praphulla Chandra Nyshadham of Bangalore (IN)]][[Category:Sanjeev Praphulla Chandra Nyshadham of Bangalore (IN)]]

[[:Category:Subrato Roy of Bangalore (IN)|Subrato Roy of Bangalore (IN)]][[Category:Subrato Roy of Bangalore (IN)]]

[[:Category:Gaurav Kumar Mittal of Bangalore (IN)|Gaurav Kumar Mittal of Bangalore (IN)]][[Category:Gaurav Kumar Mittal of Bangalore (IN)]]

==METHOD FOR MEASURING QUIESCENT CURRENT IN A SWITCHING VOLTAGE REGULATOR - A simplified explanation of the abstract==


This abstract first appeared for US patent application 17846397 titled 'METHOD FOR MEASURING QUIESCENT CURRENT IN A SWITCHING VOLTAGE REGULATOR

==Simplified Explanation==

The abstract describes a method for measuring the quiescent current in a switching voltage regulator. The method involves generating a mathematical model of the circuit design, fabricating a circuit based on the design, and measuring the parameters of the circuit to calculate the switching current and quiescent current.

* The method involves generating a mathematical model of a circuit design associated with a switching voltage regulator.
* The mathematical model includes measurable parameters that describe the switching current of a power switch in the regulator.
* A circuit is fabricated based on the circuit design, including the power switch and conductive I/O.
* The conductive I/O of the fabricated circuit is coupled to a circuit test fixture.
* Electrical signals are provided to the conductive I/O via the test fixture.
* The measurable parameters are measured in response to the electrical signals.
* The measurable parameters are applied to the mathematical model to calculate the switching current.
* The quiescent current is then calculated based on the switching current.

== Potential Applications ==
* This method can be applied in the field of power electronics for measuring the quiescent current in switching voltage regulators.
* It can be used in the design and testing of switching voltage regulators to ensure their efficiency and performance.

== Problems Solved ==
* The method solves the problem of accurately measuring the quiescent current in a switching voltage regulator.
* It provides a reliable and efficient way to calculate the switching current and quiescent current of the regulator.

== Benefits ==
* The method allows for accurate measurement and calculation of the switching current and quiescent current in a switching voltage regulator.
* It provides a cost-effective and time-efficient solution for testing and evaluating the performance of regulators.
* By accurately measuring the quiescent current, it helps in optimizing the design and efficiency of switching voltage regulators.


==Original Abstract Submitted==

One example includes a method for measuring a quiescent current in a switching voltage regulator. The method includes generating a mathematical model of a circuit design associated with the switching voltage regulator. The mathematical model includes measurable parameters to describe a switching current of a power switch of the switching voltage regulator. The method also includes fabricating a circuit comprising the switching voltage regulator based on the circuit design. The fabricated circuit includes the power switch and conductive I/O. The method also includes coupling the conductive I/O of the fabricated circuit to a circuit test fixture and providing electrical signals to the conductive I/O via the circuit test fixture. The method also includes measuring the measurable parameters in response to the electrical signals and applying the measurable parameters to the mathematical model to calculate the switching current. The method further includes calculating the quiescent current based on the switching current.



[[Category:G01R31/30]]
[[Category:G01R19/25]]