View source for 17816894. Multi-Chain Measurement Circuit simplified abstract (Apple Inc.)

=Multi-Chain Measurement Circuit=


==Organization Name==

[[:Category:Apple Inc.|Apple Inc.]]


[[Category:Apple Inc.]]

==Inventor(s)==

[[:Category:Bo Zhao of Cupertino CA (US)|Bo Zhao of Cupertino CA (US)]][[Category:Bo Zhao of Cupertino CA (US)]]

[[:Category:Joao Pedro Da Silva Cerqueira of Sunnyvale CA (US)|Joao Pedro Da Silva Cerqueira of Sunnyvale CA (US)]][[Category:Joao Pedro Da Silva Cerqueira of Sunnyvale CA (US)]]

[[:Category:Pangjie Xu of San Jose CA (US)|Pangjie Xu of San Jose CA (US)]][[Category:Pangjie Xu of San Jose CA (US)]]

[[:Category:Steven Lu of San Ramon CA (US)|Steven Lu of San Ramon CA (US)]][[Category:Steven Lu of San Ramon CA (US)]]

==Multi-Chain Measurement Circuit - A simplified explanation of the abstract==


This abstract first appeared for US patent application 17816894 titled 'Multi-Chain Measurement Circuit

==Simplified Explanation==

The patent application describes a multi-chain measurement circuit that is used to measure the propagation of an input signal through a series of buffer circuits. Here is a simplified explanation of the abstract:

* The measurement circuit consists of two chains of buffer circuits that are connected in parallel.
* Each buffer circuit in the chains propagates an input signal.
* A set of storage circuits is used to store logic values generated by the buffer circuits in response to a clock signal transition.
* The logic values stored in the storage circuits represent the total number of storage circuits through which the input signal has propagated at the time of the clock signal transition.
* This stored digital value provides information about the propagation of the input signal through the buffer circuits.

Potential Applications:

* This multi-chain measurement circuit can be used in digital systems to measure the propagation delay of signals through different stages or components.
* It can be used in testing and debugging electronic circuits to identify delays or bottlenecks in signal propagation.

Problems Solved:

* The circuit solves the problem of accurately measuring the propagation delay of an input signal through a series of buffer circuits.
* It provides a reliable method for determining the number of buffer circuits through which the signal has propagated.

Benefits:

* The circuit allows for precise measurement of signal propagation, which is crucial for optimizing the performance of digital systems.
* It provides a cost-effective solution for measuring signal delays without the need for complex and expensive equipment.
* The circuit can be easily integrated into existing electronic systems, making it a versatile tool for testing and debugging.


==Original Abstract Submitted==

A multi-chain measurement circuit is disclosed. The measurement circuit includes first and second chains of serially-connected buffer circuits coupled in parallel, each of which propagates an input signal. A set of storage circuits is configured to store logic values generated by the first and second sets of buffer circuits in response to the transitioning of a clock signal. The logic values stored in the storage circuits result in a digital value indicative of a total number of serially-connected storage circuits through which the input signal has propagated at the time of the transition of the operating clock signal



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