View source for 17784644. METHOD OF REPAIRING GATE-ON-ARRAY CIRCUIT, GATE-ON-ARRAY CIRCUIT, AND DISPLAY APPARATUS simplified abstract (BOE TECHNOLOGY GROUP CO., LTD.)

=METHOD OF REPAIRING GATE-ON-ARRAY CIRCUIT, GATE-ON-ARRAY CIRCUIT, AND DISPLAY APPARATUS=


==Organization Name==

[[:Category:BOE TECHNOLOGY GROUP CO., LTD.|BOE TECHNOLOGY GROUP CO., LTD.]]


[[Category:BOE TECHNOLOGY GROUP CO., LTD.]]

==Inventor(s)==

[[:Category:Xuehuan Feng of Beijing (CN)|Xuehuan Feng of Beijing (CN)]][[Category:Xuehuan Feng of Beijing (CN)]]

[[:Category:Xuelian Cheng of Beijing (CN)|Xuelian Cheng of Beijing (CN)]][[Category:Xuelian Cheng of Beijing (CN)]]

==METHOD OF REPAIRING GATE-ON-ARRAY CIRCUIT, GATE-ON-ARRAY CIRCUIT, AND DISPLAY APPARATUS - A simplified explanation of the abstract==


This abstract first appeared for US patent application 17784644 titled 'METHOD OF REPAIRING GATE-ON-ARRAY CIRCUIT, GATE-ON-ARRAY CIRCUIT, AND DISPLAY APPARATUS

==Simplified Explanation==

The abstract describes a method of repairing a gate-on-array circuit by disconnecting and reconnecting various signal output terminals and lines within the circuit.

* Disconnecting and reconnecting specific signal output terminals and lines within the gate-on-array circuit.
* Repairing the circuit by connecting the output lines to repair terminals through repair lines.

== Potential Applications ==
The technology described in this patent application could be applied in the field of semiconductor manufacturing, specifically in repairing gate-on-array circuits in integrated circuits.

== Problems Solved ==
This technology solves the problem of repairing gate-on-array circuits without having to replace the entire circuit, saving time and resources in the manufacturing process.

== Benefits ==
The benefits of this technology include cost savings, increased efficiency in circuit repair, and the ability to extend the lifespan of integrated circuits by repairing specific components.

== Potential Commercial Applications ==
A potential commercial application of this technology could be in the semiconductor industry for repairing gate-on-array circuits in integrated circuits.

== Possible Prior Art ==
One possible prior art for this technology could be existing methods of repairing integrated circuits, such as using laser ablation or focused ion beam techniques.

=== Unanswered Questions ===

=== How does this method compare to traditional circuit repair techniques? ===
This article does not provide a direct comparison between this method and traditional circuit repair techniques. 

=== What are the limitations of this method in terms of circuit complexity? ===
The article does not address the potential limitations of this method when dealing with highly complex gate-on-array circuits.


==Original Abstract Submitted==

A method of repairing a gate-on-array circuit is provided. The method includes at least one of disconnecting a X-th stage gate driving signal output terminal from a X-th stage gate driving signal output line; disconnecting a X-th stage compensation control signal output terminal from a X-th stage compensation control signal output line; or disconnecting a X-th stage carry signal output terminal from a X-th stage carry signal output line. The method further includes at least one of connecting the X-th stage gate driving signal output line to a repair gate driving signal output terminal through a gate driving signal output repair line; connecting the X-th stage compensation control signal output line to a repair compensation control signal output terminal through a compensation control signal output repair line; or connecting the X-th stage carry signal output line to a repair carry signal output terminal through a carry signal output repair fine.



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