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Category:G11C7/10
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Pages in category "G11C7/10"
The following 200 pages are in this category, out of 626 total.
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- 17659475. SEMICONDUCTOR MEMORY DEVICE AND MEMORY SYSTEM simplified abstract (Samsung Electronics Co., Ltd.)
- 17660232. SENSE AMPLIFIER INCLUDING PRE-AMPLIFYING CIRCUIT AND MEMORY DEVICE INCLUDING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 17686147. COMPUTE-IN-MEMORY SYSTEMS AND METHODS WITH CONFIGURABLE INPUT AND SUMMING UNITS simplified abstract (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.)
- 17689480. METHOD OF READING DATA IN A NONVOLATILE MEMORY DEVICE AND NONVOLATILE MEMORY DEVICE PERFORMING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 17722805. SEMICONDUCTOR DEVICE AND MEMORY SYSTEM INCLUDING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 17747318. METHOD OF STORING DATA IN MEMORIES simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
- 17750581. STORAGE DEVICES AND METHODS OF OPERATING STORAGE DEVICES simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17805090. MULTI-LEVEL CELLS, AND RELATED ARRAYS, DEVICES, SYSTEMS, AND METHODS simplified abstract (Micron Technology, Inc.)
- 17814640. MEMORY DEVICE, METHOD OF DRIVING THE MEMORY DEVICE, AND METHOD OF DRIVING HOST DEVICE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17815742. INDICATING A STATUS OF A MEMORY BUILT-IN SELF-TEST USING A DATA MASK INVERSION BIT simplified abstract (Micron Technology, Inc.)
- 17821676. MEMORY WITH PARALLEL MAIN AND TEST INTERFACES simplified abstract (Micron Technology, Inc.)
- 17821740. Synchronous Input Buffer Control Using a State Machine simplified abstract (Micron Technology, Inc.)
- 17822909. APPARATUSES, SYSTEMS, AND METHODS FOR MODULE LEVEL ERROR CORRECTION simplified abstract (Micron Technology, Inc.)
- 17823458. Die Disablement simplified abstract (Micron Technology, Inc.)
- 17827126. RECEIVER FOR RECEIVING MULTI-LEVEL SIGNAL AND MEMORY DEVICE INCLUDING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 17831114. TRACKING THE EFFECTS OF VOLTAGE AND TEMPERATURE ON A MEMORY DEVICE USING AN INTERNAL OSCILLATOR simplified abstract (Micron Technology, Inc.)
- 17831251. SYNCHRONOUS INPUT BUFFER ENABLE FOR DFE OPERATION simplified abstract (Micron Technology, Inc.)
- 17831284. MEMORY CONTROLLER AND STORAGE DEVICE simplified abstract (Samsung Electronics Co., Ltd.)
- 17831290. PRE-DECODER CIRCUITY simplified abstract (Micron Technology, Inc.)
- 17832261. MEMORY DEVICE AND METHOD simplified abstract (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.)
- 17836634. MEMORY ARRAYS EMPLOYING FLYING BIT LINES TO INCREASE EFFECTIVE BIT LINE LENGTH FOR SUPPORTING HIGHER PERFORMANCE, INCREASED MEMORY DENSITY, AND RELATED METHODS simplified abstract (Microsoft Technology Licensing, LLC)
- 17847080. DATA STORAGE DEVICE WITH NOISE INJECTION simplified abstract (Western Digital Technologies, Inc.)
- 17852593. MEMORY DEVICE, MEMORY SYSTEM HAVING THE SAME, AND METHOD OF OPERATING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 17852664. MEMORY DEVICE AND METHOD FOR CALIBRATING THE DEVICE AND FABRICATING THE DEVICE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17869061. MEMORY DEVICE, A MEMORY SYSTEM AND AN OPERATING METHOD OF THE MEMORY DEVICE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17871917. MEMORY DEVICE AND METHOD FOR CONTROLLING ROW HAMMER simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17877592. MEMORY ROW-HAMMER MITIGATION simplified abstract (Micron Technology, Inc.)
- 17886423. METHOD FOR CONTROLLING SENSE AMPLIFIER AND CONTROL DEVICE USING THE SAME simplified abstract (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.)
- 17889369. ERROR DETECTION FOR A SEMICONDUCTOR DEVICE simplified abstract (Micron Technology, Inc.)
- 17894248. APPARATUS AND METHODS FOR PROGRAMMING DATA STATES OF MEMORY CELLS simplified abstract (Micron Technology, Inc.)
- 17895053. CONFIGURABLE DATA PROTECTION CIRCUITRY FOR MEMORY DEVICES simplified abstract (Micron Technology, Inc.)
- 17897438. DETERMINING READ VOLTAGE OFFSET IN MEMORY DEVICES simplified abstract (Micron Technology, Inc.)
- 17899417. MANAGING PERFORMANCE AND SERVICE LIFE PREDICTION FOR A MEMORY SUBSYSTEM USING ENVIRONMENTAL FACTORS simplified abstract (Micron Technology, Inc.)
- 17899849. MEMORY ARRAY WITH COMPENSATED WORD LINE ACCESS DELAY simplified abstract (Micron Technology, Inc.)
- 17903578. CALIBRATION CIRCUIT AND SEMICONDUCTOR DEVICE INCLUDING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 17930655. Synchronous Input Buffer Control Using a Ripple Counter simplified abstract (Micron Technology, Inc.)
- 17940935. Model Inversion in Integrated Circuit Devices having Analog Inference Capability simplified abstract (Micron Technology, Inc.)
- 17940955. Monitoring of User-Selected Conditions simplified abstract (Micron Technology, Inc.)
- 17942944. TEST MODE SECURITY CIRCUIT simplified abstract (Micron Technology, Inc.)
- 17944390. MATRIX FORMATION FOR PERFORMING COMPUTATIONAL OPERATIONS IN MEMORY simplified abstract (Micron Technology, Inc.)
- 17948423. DRIFT COMPENSATION FOR CODEWORDS IN MEMORY simplified abstract (Micron Technology, Inc.)
- 17949990. PPA IMPROVEMENT FOR VOLTAGE MODE DRIVER AND ON-DIE TERMINATION (ODT) simplified abstract (SanDisk Technologies LLC)
- 17951567. SEMICONDUCTOR DEVICE AND MEMORY SYSTEM INCLUDING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17956784. Data Storage with Improved Cache Read simplified abstract (Western Digital Technologies, Inc.)
- 17958386. NONVOLATILE MEMORY DEVICES simplified abstract (Samsung Electronics Co., Ltd.)
- 17959663. APPARATUS, MEMORY DEVICE, AND METHOD FOR MULTI-PHASE CLOCK TRAINING simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17962992. RECEIVER RECEIVING MULTI-LEVEL SIGNAL, MEMORY DEVICE INCLUDING THE SAME AND METHOD OF RECEIVING DATA USING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 17965369. APPARATUS AND METHOD FOR READING DATA BASED ON A PROGRAM STATUS OF A NON-VOLATILE MEMORY DEVICE simplified abstract (SK hynix Inc.)
- 17972300. NON-VOLATILE MEMORY DEVICE FOR DETECTING DEFECTS OF BIT LINES AND WORD LINES simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17984750. COMPENSATION FOR CONDUCTANCE DRIFT IN ANALOG MEMORY simplified abstract (INTERNATIONAL BUSINESS MACHINES CORPORATION)
- 17984757. APPARATUS AND METHOD FOR ZQ CALIBRATION simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17988797. PAGE BUFFER CIRCUIT AND MEMORY DEVICE INCLUDING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18051142. STATIC RANDOM-ACCESS MEMORY (SRAM) APPARATUS AND METHOD FOR REDUCING WIRE DELAY simplified abstract (Samsung Electronics Co., Ltd.)
- 18055588. APPARATUSES AND METHODS FOR INPUT BUFFER DATA FEEDBACK EQUALIZATION CIRCUITS simplified abstract (Micron Technology, Inc.)
- 18056158. PHYSICALLY UNCLONABLE CELL USING DUAL-INTERLOCKING AND ERROR CORRECTION TECHNIQUES simplified abstract (NVIDIA Corporation)
- 18057328. NON-VOLATILE MEMORY DEVICE, METHOD OF OPERATING THE DEVICE, AND MEMORY SYSTEM INCLUDING THE DEVICE simplified abstract (Samsung Electronics Co., Ltd.)
- 18067224. NON-VOLATILE MEMORY DEVICE, STORAGE DEVICE INCLUDING THE SAME, AND READ METHOD THEREOF simplified abstract (Samsung Electronics Co., Ltd.)
- 18080282. MEMORY DEVICE INCLUDING ERROR CORRECTION DEVICE simplified abstract (SK hynix Inc.)
- 18090574. SINGLE PORT MEMORY WITH MUTLITPLE MEMORY OPERATIONS PER CLOCK CYCLE simplified abstract (XILINX, INC.)
- 18090736. WRONG WAY READ-BEFORE WRITE SOLUTIONS IN SRAM simplified abstract (Advanced Micro Devices, Inc.)
- 18090736. WRONG WAY READ-BEFORE WRITE SOLUTIONS IN SRAM simplified abstract (ATI Technologies ULC)
- 18093728. RANDOM DATA GENERATION CIRCUIT AND READ/WRITE TRAINING CIRCUIT simplified abstract (Changxin Memory Technologies, Inc.)
- 18108737. DEVICE AND METHOD WITH COMPUTATIONAL MEMORY simplified abstract (Samsung Electronics Co., Ltd.)
- 18115999. PIPE REGISTER AND SEMICONDUCTOR APPARATUS INCLUDING THE PIPE REGISTER simplified abstract (SK hynix Inc.)
- 18144531. SEMICONDUCTOR MEMORY DEVICE AND OPERATION METHOD THEREOF simplified abstract (Samsung Electronics Co., Ltd.)
- 18152919. DATA RECEIVING CIRCUIT, DATA RECEIVING SYSTEM, AND MEMORY DEVICE simplified abstract (Changxin Memory Technologies, Inc.)
- 18163146. MEMORY CIRCUIT ARCHITECTURE simplified abstract (QUALCOMM Incorporated)
- 18166737. MEMORY DEVICE, MEMORY SYSTEM AND METHOD FOR OPERATING MEMORY SYSTEM simplified abstract (Samsung Electronics Co., Ltd.)
- 18170109. MEMORY DEVICE simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)
- 18176121. POWER REDUCTION IN A CLOCK BUFFER OF A MEMORY MODULE BASED UPON MEMORY MODULE SPEED simplified abstract (Dell Products L.P.)
- 18176268. CONTROLLING MEMORY MODULE CLOCK BUFFER POWER IN A SYSTEM WITH A SINGLE MEMORY CLOCK PER MEMORY MODULE simplified abstract (Dell Products L.P.)
- 18178038. SEMICONDUCTOR DEVICE simplified abstract (Kioxia Corporation)
- 18184329. SEMICONDUCTOR STORAGE DEVICE simplified abstract (KABUSHIKI KAISHA TOSHIBA)
- 18184329. SEMICONDUCTOR STORAGE DEVICE simplified abstract (TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION)
- 18198623. GENERATING SEMI-SOFT BIT DATA DURING CORRECTIVE READ OPERATIONS IN MEMORY DEVICES simplified abstract (Micron Technology, Inc.)
- 18201089. MINIMUM MEMORY CLOCK ESTIMATION PROCEDURES simplified abstract (Micron Technology, Inc.)
- 18203754. MEMORY DEVICE INCLUDING PAGE BUFFER CIRCUIT simplified abstract (Samsung Electronics Co., Ltd.)
- 18209057. ADDRESS DECODING METHOD, AND MEMORY CONTROLLER AND SEMICONDUCTOR MEMORY SYSTEM USING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 18215036. SEMICONDUCTOR SYSTEM simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18216424. LEAKAGE COMPENSATED DYNAMIC LATCH (Intel Corporation)
- 18220363. Storage System and Method for Circuit-Bounded-Array-Based Time and Temperature Tag Management and Inference of Read Thresholds simplified abstract (Western Digital Technologies, Inc.)
- 18230776. TRANSMITTER, MEMORY DEVICE AND SEMICONDUCTOR DEVICE INCLUDING THE TRANSMITTER simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18231935. DATA CONVERTER FOR CANCELLING OFFSET VOLTAGE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18235848. ZQ CALIBRATION CIRCUIT, OPERATION METHOD OF THE ZQ CALIBRATION CIRCUIT, AND SEMICONDUCTOR MEMORY DEVICE simplified abstract (Samsung Electronics Co., Ltd.)
- 18237816. CROSS-TEMPERATURE COMPENSATION IN A MEMORY SUB-SYSTEM simplified abstract (Micron Technology, Inc.)
- 18238232. MEMORY DEVICE AND MEMORY SYSTEM simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18243350. MEMORY DEVICE, METHOD OF CALIBRATING SIGNAL LEVEL THEREOF, AND MEMORY SYSTEM HAVING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18296367. IMPEDANCE ADJUSTING CIRCUIT AND IMPEDANCE ADJUSTING METHOD FOR ZERO QUOTIENT CALIBRATION simplified abstract (NANYA TECHNOLOGY CORPORATION)
- 18301441. SEMICONDUCTOR SYSTEM simplified abstract (SK hynix Inc.)
- 18303937. METHOD OF READING DATA FROM SELF-SELECTING MEMORY, SELF-SELECTING MEMORY PERFORMING THE SAME AND METHOD OF OPERATING SELF-SELECTING MEMORY USING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 18304238. SEMICONDUCTOR DEVICE AND METHOD OF OPERATING THE SAME CAPABLE OF PREVENTING MALFUNCTION DURING READ OPERATION simplified abstract (SK hynix Inc.)
- 18317344. STORAGE DEVICES HAVING MULTI DROP STRUCTURE simplified abstract (Samsung Electronics Co., Ltd.)
- 18318637. BUS INVERSION ENCODER MODULE AND BUS INVERSION SYSTEM INCLUDING THE SAME simplified abstract (SK Hynix Inc.)
- 18322725. STORAGE DEVICE, NON-VOLATILE MEMORY DEVICE, AND METHOD OF OPERATING THE NON-VOLATILE MEMORY DEVICE simplified abstract (Samsung Electronics Co., Ltd.)
- 18323507. STORAGE DEVICE AND OPERATING METHOD THEREOF simplified abstract (SK hynix Inc.)
- 18325882. INPUT/OUTPUT CIRCUIT, MEMORY DIE, MEMORY DEVICE, AND STORAGE DEVICE simplified abstract (SK hynix Inc.)
- 18328781. MEMORY DEVICE INCLUDING MEMORY PACKAGE AND MEMORY SYSTEM INCLUDING THE MEMORY DEVICE simplified abstract (SK hynix Inc.)
- 18329557. MEMORY SYSTEM AND OPERATING METHOD OF THE SAME simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
- 18331223. EQUALIZER FOR REMOVING INTER SYMBOL INTERFERENCE OF DATA SIGNAL BY INCREASING PULSE WIDTHS OF LOGIC LOW LEVEL AND LOGIC HIGH LEVEL OF DATA SIGNAL simplified abstract (Samsung Electronics Co., Ltd.)
- 18333592. Tracking Circuitry and Memory Devices Including the Same simplified abstract (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.)
- 18336302. SEMICONDUCTOR INTEGRATED CIRCUIT, RECEIVING DEVICE, AND MEMORY SYSTEM simplified abstract (Kioxia Corporation)
- 18336758. SHARED METAL WIRE CAPACITANCE FOR NEGATIVE BIT-LINE (NVIDIA Corporation)
- 18339101. SEMICONDUCTOR SYSTEM FOR PERFORMING A DATA ALIGNMENT OPERATION simplified abstract (SK hynix Inc.)
- 18343929. APPARATUSES AND METHODS FOR MEMORY ALIGNMENT simplified abstract (MICRON TECHNOLOGY, INC.)
- 18346329. FOLDING ORDERING SCHEME FOR IMPROVED THROUGHPUT IN NON-VOLATILE MEMORY simplified abstract (Western Digital Technologies, Inc.)
- 18347641. OFFSET CALIBRATION TRAINING METHOD FOR ADJUSTING DATA RECEIVER OFFSET AND MEMORY DEVICE THEREFOR simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18351039. APPARATUS AND METHOD WITH IN-MEMORY COMPUTING (IMC) simplified abstract (Samsung Electronics Co., Ltd.)
- 18351629. Global Boosting Circuit simplified abstract (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.)
- 18354869. MEMORY DEVICE AND SYSTEM DEVICE INCLUDING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 18355046. METHOD AND MEMORY DEVICE WITH IN-MEMORY COMPUTING simplified abstract (Samsung Electronics Co., Ltd.)
- 18357208. GENERATING A RANDOM NUMBER USING A NON-VOLATILE MEMORY BASED PHYSICAL UNCLONEABLE FUNCTION simplified abstract (Western Digital Technologies, Inc.)
- 18361132. NONVOLATILE MEMORY INCLUDING ON-DIE-TERMINATION CIRCUIT AND STORAGE DEVICE INCLUDING THE NONVOLATILE MEMORY simplified abstract (Samsung Electronics Co., Ltd.)
- 18364026. MEMORY DEVICE AND ZQ CALIBRATION METHOD simplified abstract (Changxin Memory Technologies, Inc.)
- 18364490. MEMORY DEVICE AND ZQ CALIBRATION METHOD simplified abstract (Changxin Memory Technologies, Inc.)
- 18368907. MEMORY DEVICE AND OPERATING METHOD THEREOF simplified abstract (Samsung Electronics Co., Ltd.)
- 18371441. MEMORY WITH FLY-BITLINES THAT WORK WITH SINGLE-ENDED SENSING AND ASSOCIATED MEMORY ACCESS METHOD simplified abstract (MEDIATEK INC.)
- 18372726. APPARATUS FOR TRANSMITTING AND RECEIVING A SIGNAL, A METHOD OF OPERATING THE SAME, A MEMORY DEVICE, AND A METHOD OF OPERATING THE MEMORY DEVICE simplified abstract (Samsung Electronics Co., Ltd.)
- 18374026. NON-VOLATILE MEMORY DEVICE, OPERATING METHOD THEREOF, CONTROLLER FOR CONTROLLING THE SAME, AND STORAGE DEVICE HAVING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18382565. MEMORY CLOCK CONTROL CIRCUIT AND METHOD FOR CONTROLLING MEMORY CLOCK (Realtek Semiconductor Corp.)
- 18388461. TECHNOLOGIES FOR DYNAMICALLY MANAGING RESOURCES IN DISAGGREGATED ACCELERATORS simplified abstract (Intel Corporation)
- 18392199. STORAGE DEVICE AND DATA TRAINING METHOD THEREOF simplified abstract (Samsung Electronics Co., Ltd.)
- 18394640. PAGE BUFFER BLOCK AND MEMORY DEVICE INCLUDING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18396186. MEMORY REFRESH simplified abstract (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.)
- 18398930. MEMORY DEVICE AND METHOD OF SEARCHING FOR OPTIMUM CALIBRATION CODE CORRESPONDING TO CURRENT PVT USING LOOK-UP TABLE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18399864. MEMORY DEVICE AND OPERATION METHOD THEREOF simplified abstract (Samsung Electronics Co., Ltd.)
- 18403480. APPARATUSES AND METHODS FOR STORING AND WRITING MULTIPLE PARAMETER CODES FOR MEMORY OPERATING PARAMETERS simplified abstract (Lodestar Licensing Group LLC)
- 18406424. BIT COUNTING CIRCUITS AND MEMORY DEVICES INCLUDING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 18407062. INTERNAL AND EXTERNAL DATA TRANSFER FOR STACKED MEMORY DIES simplified abstract (Micron Technology, Inc.)
- 18408228. TECHNIQUES FOR INDICATING ROW ACTIVATION simplified abstract (MICRON TECHNOLOGY, INC.)
- 18408252. SIGNAL DEVELOPMENT CIRCUITRY LAYOUTS IN A MEMORY DEVICE simplified abstract (MICRON TECHNOLOGY, INC.)
- 18416770. READ OPERATIONS FOR A MEMORY ARRAY AND REGISTER simplified abstract (Micron Technology, Inc.)
- 18418001. MEMORY DEVICE INCLUDING VOLTAGE GENERATING CIRCUIT AND OPERATION METHOD OF MEMORY DEVICE (Samsung Electronics Co., Ltd.)
- 18419959. RECEIVER, OPERATION METHOD THEREOF, AND MEMORY DEVICE (SAMSUNG ELECTRONICS CO., LTD.)
- 18420404. Programmable Memory Timing simplified abstract (Micron Technology, Inc.)
- 18420867. MEMORY DEVICE FOR CONTROLLING A DATA OUTPUT ORDER AND AN OPERATING METHOD THEREOF simplified abstract (Samsung Electronics Co., Ltd.)
- 18421686. APPARATUS INCLUDING RECONFIGURABLE INTERFACE AND METHODS OF MANUFACTURING THE SAME simplified abstract (Micron Technology, Inc.)
- 18422908. SIGNAL GENERATOR FOR CONTROLLING TIMING OF SIGNAL IN MEMORY DEVICE simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)
- 18423059. READ COMMAND FAULT DETECTION IN A MEMORY SYSTEM simplified abstract (Micron Technology, Inc.)
- 18434418. INDICATION IN MEMORY SYSTEM OR SUB-SYSTEM OF LATENCY ASSOCIATED WITH PERFORMING AN ACCESS COMMAND simplified abstract (Lodestar Licensing Group LLC)
- 18436025. MEMORY SYSTEM AND OPERATING METHOD OF THE MEMORY SYSTEM simplified abstract (SK hynix Inc.)
- 18437394. MULTI-BIT CELL AND MULTI-BIT CELL ARRAY INCLUDING THE SAME (SAMSUNG ELECTRONICS CO., LTD.)
- 18441089. PSEUDO DUAL PORT MEMORY DEVICES simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18442660. METHODS AND APPARATUS TO FACILITATE ATOMIC OPERATIONS IN VICTIM CACHE simplified abstract (TEXAS INSTRUMENTS INCORPORATED)
- 18448393. TEMPERATURE BASED BLOCK READ simplified abstract (Western Digital Technologies, Inc.)
- 18448902. MEMORY DEVICE AND ZQ CALIBRATION METHOD simplified abstract (Changxin Memory Technologies, Inc.)
- 18450413. MEMORY DEVICE FOR STORING PLURALITY OF DATA BITS AND METHOD OF OPERATING THE SAME simplified abstract (SK hynix Inc.)
- 18451946. MEMORY DEVICE simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)
- 18451969. MEMORY DEVICE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18455575. MEMORY SYSTEM HAVING A NON-VOLATILE MEMORY AND A CONTROLLER CONFIGURED TO SWITCH A MODE FOR CONTROLLING AN ACCESS OPERATION TO THE NON-VOLATILE MEMORY simplified abstract (Kioxia Corporation)
- 18455904. MEMORY DEVICE AND MEMORY SYSTEM INCLUDING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 18455953. APPARATUSES AND METHODS FOR PROVIDING COMMAND HAVING ON-THE-FLY (OTF) LATENCY TO MEMORY simplified abstract (Samsung Electronics Co., Ltd.)
- 18457742. MEMORY CHIP, MEMORY CONTROLLER AND OPERATING METHOD OF THE MEMORY CHIP simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18458152. MEMORY DEVICE SUPPORTING PARALLEL COMPRESSION READ OPERATION AND MEMORY SYSTEM INCLUDING THE SAME simplified abstract (SK hynix Inc.)
- 18458165. SIGNAL TRANSMISSION CIRCUIT AND MEMORY DEVICE INCLUDING THE SAME simplified abstract (SK hynix Inc.)
- 18458415. SEMICONDUCTOR SYSTEMS WITH DATA CLOCK APPLIED simplified abstract (SK hynix Inc.)
- 18462254. POWER GATING CONTROL CIRCUIT, AND SEMICONDUCTOR APPARATUS AND SEMICONDUCTOR SYSTEM USING THE SAME simplified abstract (SK hynix Inc.)
- 18464262. MULTI-CIRCUIT CONTROL SYSTEM AND READING METHOD FOR STATUS INFORMATION THEREOF (Macronix International Co., Ltd.)
- 18464618. ZQ CALIBRATION CIRCUIT FOR MULTIPLE INTERFACES simplified abstract (Samsung Electronics Co., Ltd.)
- 18465416. MEMORY SYSTEMS AND DEVICES THAT SUPPORT METHODS FOR CALIBRATING INPUT OFFSETS THEREIN simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18466110. STATIC RANDOM ACCESS MEMORY (SRAM) FAULT CORRECTION (QUALCOMM Incorporated)
- 18468227. MEMORY DEVICE AND METHOD FOR TRAINING PER-PIN OPERATION PARAMETERS simplified abstract (Samsung Electronics Co., Ltd.)
- 18469989. HIGH SPEED MEMORY CIRCUIT ARCHITECTURE WITH IMPROVED AREA AND POWER EFFICIENCY (QUALCOMM Incorporated)
- 18473492. OPERATING METHOD OF MEMORY CONTROLLER, AND MEMORY DEVICE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18473492. OPERATING METHOD OF MEMORY CONTROLLER, AND MEMORY DEVICE simplified abstract (Samsung Electronics Co., Ltd.)
- 18473492. OPERATING METHOD OF MEMORY CONTROLLER, AND MEMORY DEVICE simplified abstract (SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION)
- 18473837. RECEIVERS AND SEMICONDUCTOR MEMORY DEVICES INCLUDING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18475890. System Control Using Sparse Data simplified abstract (Apple Inc.)
- 18476938. MASK PATTERNS GENERATED IN MEMORY FROM SEED VECTORS simplified abstract (Lodestar Licensing Group LLC)
- 18481855. APPARATUSES AND METHODS INCLUDING CIRCUITS IN GAP REGIONS OF A MEMORY ARRAY simplified abstract (Micron Technology, Inc.)
- 18486518. SEMICONDUCTOR MEMORY DEVICE EMPLOYING PROCESSING IN MEMORY (PIM) AND METHOD OF OPERATING THE SEMICONDUCTOR MEMORY DEVICE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18493051. MEMORY DEVICE AND OPERATION METHOD THEREOF simplified abstract (Samsung Electronics Co., Ltd.)
- 18496693. APPARATUS, MEMORY CONTROLLER, MEMORY DEVICE, MEMORY SYSTEM, AND METHOD FOR CLOCK SWITCHING AND LOW POWER CONSUMPTION simplified abstract (Samsung Electronics Co., Ltd.)
- 18497747. CLOCK DISTRIBUTION NETWORK, AND A SEMICONDUCTOR APPARATUS AND A SEMICONDUCTOR SYSTEM INCLUDING THE SAME simplified abstract (SK hynix Inc.)
- 18504353. APPARATUSES AND METHODS FOR SEPARATE WRITE ENABLE FOR SINGLE-PASS ACCESS OF DATA, METADATA, AND PARITY INFORMATION simplified abstract (Micron Technology, Inc.)
- 18505372. PROGRAMMABLE SIGNAL PROCESSING APPARATUS simplified abstract (CANON KABUSHIKI KAISHA)
- 18509039. BUFFER CHIP, AND SEMICONDUCTOR PACKAGE INCLUDING THE BUFFER CHIP AND A MEMORY CHIP simplified abstract (SK hynix Inc.)
- 18509082. MULTI-PORT MEMORY DEVICE AND A METHOD OF USING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18509145. BUFFER CHIP, SEMICONDUCTOR PACKAGE INCLUDING BUFFER CHIP AND MEMORY CHIP, MEMORY MODULE, AND OPERATION METHOD OF SEMICONDUCTOR PACKAGE simplified abstract (SK hynix Inc.)
- 18513303. REDUCED RESISTIVITY FOR ACCESS LINES IN A MEMORY ARRAY simplified abstract (Micron Technology, Inc.)
- 18515790. SEMICONDUCTOR APPARATUS AND SEMICONDUCTOR SYSTEM HAVING LUN SELECTION CYCLE, AND OPERATING METHOD OF SEMICONDUCTOR SYSTEM (SK hynix Inc.)
- 18516143. BUFFER CONTROL OF MULTIPLE MEMORY BANKS simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
- 18518157. LOW POWER WAKE UP FOR MEMORY simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
- 18520189. Sharable Usage-Based Disturbance Circuitry simplified abstract (Micron Technology, Inc.)
- 18520612. Memory system simplified abstract (Kioxia Corporation)
- 18524252. STORAGE DEVICE AND DISPLAY simplified abstract (Shenzhen China Star Optoelectronics Semiconductor Display Technology Co., Ltd.)
- 18538263. MEMORY DEVICE PERFORMING SELF-CALIBRATION BY IDENTIFYING LOCATION INFORMATION AND MEMORY MODULE INCLUDING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 18538652. DYNAMIC PROGRAMMING TIME FOR A MEMORY DEVICE simplified abstract (MICRON TECHNOLOGY, INC.)
- 18544550. DEVICE INCLUDING INPUT/OUTPUT CIRCUIT, A SYSTEM INCLUDING THE DEVICE, AND AN OPERATING METHOD OF THE SYSTEM simplified abstract (Samsung Electronics Co., Ltd.)
- 18545860. DATA TRANSMISSION/RECEIVING CIRCUIT, DATA TRAINING CIRCUIT AND SEMICONDUCTOR APPARATUS INCLUDING THE SAME (SK hynix Inc.)
- 18581018. NONVOLATILE MEMORY DEVICES simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18583568. READING METHOD FOR A MEMORY simplified abstract (STMicroelectronics International N.V.)
- 18584151. METHODS AND APPARATUS TO REDUCE READ-MODIFY-WRITE CYCLES FOR NON-ALIGNED WRITES simplified abstract (Texas Instruments Incorporated)
- 18585184. Bit Line Pre-Charge Circuit for Power Management Modes in Multi Bank SRAM simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
- 18587961. SEMICONDUCTOR DEVICE INCLUDING INTERNAL TRANSMISSION PATH AND STACKED SEMICONDUCTOR DEVICE USING THE SAME simplified abstract (SK hynix Inc.)
- 18589184. READ BROADCAST OPERATIONS ASSOCIATED WITH A MEMORY DEVICE simplified abstract (Micron Technology, Inc.)
- 18589303. SEMICONDUCTOR MEMORY DEVICE simplified abstract (Kioxia Corporation)
- 18589628. SEMICONDUCTOR MEMORY DEVICE AND MEMORY SYSTEM simplified abstract (Kioxia Corporation)
- 18595869. MEMORY DEVICE simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
- 18597576. TECHNIQUES TO CONFIGURE DRIVERS simplified abstract (Micron Technology, Inc.)
- 18597860. Sense Amplifier and Method Thereof simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
