There is currently no text in this page. You can search for this page title in other pages, or search the related logs, but you do not have permission to create this page.
Category:G01R31/28
Jump to navigation
Jump to search
(previous page) (next page)
Subcategories
This category has the following 66 subcategories, out of 66 total.
B
C
D
E
H
I
J
K
L
M
R
S
T
V
W
Y
Z
Pages in category "G01R31/28"
The following 200 pages are in this category, out of 309 total.
(previous page) (next page)1
- 17530035. MODULAR AND ADJUSTABLE THERMAL LOAD TEST VEHICLE simplified abstract (MICROSOFT TECHNOLOGY LICENSING, LLC)
- 17533194. LOGIC LOCKING WITH RANDOM KEY simplified abstract (International Business Machines Corporation)
- 17540835. LOCALIZED MAGNETIC FIELD TESTING simplified abstract (INTERNATIONAL BUSINESS MACHINES CORPORATION)
- 17541708. MIXED HIGH-RESOLUTION AND LOW-RESOLUTION INSPECTION FOR TAMPER DETECTION simplified abstract (INTERNATIONAL BUSINESS MACHINES CORPORATION)
- 17550157. INTEGRATED CIRCUIT CHIP HAVING BACK-SURFACE TOPOGRAPHY FOR ENHANCED COOLING DURING CHIP TESTING simplified abstract (INTERNATIONAL BUSINESS MACHINES CORPORATION)
- 17643216. TESTING A SINGLE CHIP IN A WAFER PROBING SYSTEM simplified abstract (INTERNATIONAL BUSINESS MACHINES CORPORATION)
- 17738272. TEST SOCKET FOR PERFORMING A TEST ON AN ELECTRONIC DEVICE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17773132. DETECTION METHOD AND APPARATUS FOR LINK, ELECTRONIC DEVICE AND COMPUTER-READABLE MEDIUM simplified abstract (ZTE CORPORATION)
- 17791262. DISPLAY PANEL AND TEST METHOD THEREOF, DISPLAY APPARATUS simplified abstract (BOE TECHNOLOGY GROUP CO., LTD.)
- 17808357. INTEGRATED CIRCUIT PACKAGE WITH INTERNAL CIRCUITRY TO DETECT EXTERNAL COMPONENT PARAMETERS AND PARASITICS simplified abstract (QUALCOMM Incorporated)
- 17832488. INTERCONNECT STRUCTURES IN INTEGRATED CIRCUIT CHIPS simplified abstract (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.)
- 17850858. INTEGRATED CIRCUIT TEST SOCKET WITH INTEGRATED DEVICE PICKING MECHANISM simplified abstract (Western Digital Technologies, Inc.)
- 17870034. FUSE LIFE EXPECTANCY PREDICTION DEVICE FOR ELECTRIC VEHICLE BATTERY AND PREDICTION METHOD THEREOF simplified abstract (Hyundai Motor Company)
- 17870034. FUSE LIFE EXPECTANCY PREDICTION DEVICE FOR ELECTRIC VEHICLE BATTERY AND PREDICTION METHOD THEREOF simplified abstract (Kia Corporation)
- 17873385. SEMICONDUCTOR DEVICE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17933739. SENSOR RELIABILITY DETECTION AND POWER MANAGEMENT simplified abstract (STMICROELECTRONICS S.R.L.)
- 17966456. METHOD AND APPARATUS FOR DIAGNOSING ELECTRONIC APPARATUS simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17979849. SEMICONDUCTOR SUBSTRATE AND ELECTRICAL INSPECTION METHOD simplified abstract (CANON KABUSHIKI KAISHA)
- 18008378. FLEXIBLE CIRCUIT BOARD TEST DEVICE simplified abstract (HONOR DEVICE CO., LTD.)
- 18047366. SEMICONDUCTOR CHIP AND TEST METHOD OF THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18062125. BALL GRID ARRAY CURRENT METER WITH A CURRENT SENSE WIRE simplified abstract (International Business Machines Corporation)
- 18070534. METHOD FOR ACCURATE REFERENCE VOLTAGE TRIMMING simplified abstract (TEXAS INSTRUMENTS INCORPORATED)
- 18071399. ENHANCED JET IMPINGEMENT LEAK PREVENTION FOR INTEGRATED CIRCUIT simplified abstract (Intel Corporation)
- 18089411. ENHANCED STATIC-DYNAMIC STRESS TECHNIQUES TO ACCELERATE LATENT DEFECTS FOR INTEGRATED CIRCUITS simplified abstract (Intel Corporation)
- 18090422. METHOD AND SYSTEM FOR A VACUUM COMPATIBLE ELECTRICAL INTERFACE, ENABLING MICROPROCESSOR DEBUG, AT HIGH SPEED, INSIDE AN ELECTRON BEAM PROBE simplified abstract (Intel Corporation)
- 18110572. AUTOMATIC BOARD PROBING STATION simplified abstract (NVIDIA Corporation)
- 18113964. SEMICONDUCTOR DEVICE AND METHOD FOR PERFORMING CRACK DETECTION OPERATION simplified abstract (SK hynix Inc.)
- 18147878. APPARATUS AND METHOD FOR TIN WHISKER ISOLATION AND DETECTION simplified abstract (INTERNATIONAL BUSINESS MACHINES CORPORATION)
- 18149536. TEST SYSTEM FOR DETECTING FAULTS IN MULTIPLE DEVICES OF THE SAME TYPE simplified abstract (NXP B.V.)
- 18151959. TEST CIRCUIT AND METHOD simplified abstract (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.)
- 18158709. LOW POWER ARCHITECTURE FOR CHIPLETS simplified abstract (QUALCOMM Incorporated)
- 18163888. METHOD OF MEASURING CHIP CHARACTERISTICS, TEST DEVICE AND NON-TRANSITORY COMPUTER READABLE MEDIA simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)
- 18172488. DEFECT DETECTION SYSTEM FOR CAVITY IN INTEGRATED CIRCUIT simplified abstract (GlobalFoundries U.S. Inc.)
- 18174865. SEMICONDUCTOR CHIP AND SEMICONDUCTOR PACKAGE INCLUDING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 18177470. DISTRIBUTED BUILT-IN SELF-TEST AND MONITORING simplified abstract (QUALCOMM Incorporated)
- 18177809. TEST SYSTEM, TEST METHOD, AND NON-TRANSITORY COMPUTER READABLE MEDIUM simplified abstract (Kioxia Corporation)
- 18183446. APPARATUS FOR TESTING IMAGE SENSOR AND OPERATING METHOD THEREOF simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18191787. Forming Trench In IC Chip Through Multiple Trench Formation And Deposition Processes simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)
- 18192745. Repackaging IC Chip For Fault Identification simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)
- 18192770. Forming Openings Through Carrier Substrate of IC Package Assembly for Fault Identification simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)
- 18193462. SENSOR CIRCUITS, ELECTRONIC DEVICES, AND METHODS FOR PERFORMING INTERNAL CALIBRATION OPERATIONS simplified abstract (SK hynix Inc.)
- 18203138. SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE INSPECTION METHOD simplified abstract (Samsung Electronics Co., Ltd.)
- 18223790. SEMICONDUCTOR PACKAGE INCLUDING TEST PATTERN AND METHOD OF FABRICATING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 18228054. APPARATUS AND METHOD FOR COUPLING TO AN ELECTRICAL INTERFACE OF A CIRCUIT BOARD simplified abstract (Western Digital Technologies, Inc.)
- 18232056. SEMICONDUCTOR WAFER TEST SYSTEM BY FEEDBACK CONTROL simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18240957. SEMICONDUCTOR TEST DEVICE AND SYSTEM AND TEST METHOD USING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18264319. METHOD FOR SETTING UP TEST APPARATUS AND TEST APPARATUS simplified abstract (Tokyo Electron Limited)
- 18272432. SELF-DIAGNOSIS CIRCUIT AND SEMICONDUCTOR DEVICE simplified abstract (Rohm Co., Ltd.)
- 18290459. IC NOISE IMMUNITY DETECTION DEVICE AND IC NOISE IMMUNITY DETECTION METHOD simplified abstract (Mitsubishi Electric Corporation)
- 18299265. WAFER-LEVEL MULTI-DEVICE TESTER AND SYSTEM INCLUDING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18303845. TEST BOARD AND TEST DEVICE INCLUDING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18315432. SEMICONDUCTOR DEVICE HAVING DEFECT DETECTION CIRCUIT simplified abstract (SK hynix Inc.)
- 18317100. TESTING DEVICE AND TESTING METHOD THEREOF simplified abstract (Winbond Electronics Corp.)
- 18319507. PROBE CARD AND CALIBRATION METHOD FOR PROBER simplified abstract (United Microelectronics Corp.)
- 18341818. SEMICONDUCTOR DEVICE INCLUDING CRACK DETECTION STRUCTURE AND METHOD OF DETECTING PROGRESSIVE CRACK IN SEMICONDUCTOR DEVICE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18344623. CALIBRATION FOR ROUTING RESISTANCE INDUCED ERROR simplified abstract (Texas Instruments Incorporated)
- 18344869. APPARATUS AND METHOD FOR DETECTING WARPAGE IN AN ELECTRONIC SYSTEM (Intel Corporation)
- 18345141. CHANNEL IMPEDANCE MEASUREMENT INSTRUMENT (DELL PRODUCTS L.P.)
- 18345469. INSPECTION DEVICE FOR DISPLAY APPARATUS AND INSPECTION METHOD FOR DISPLAY APPARATUS simplified abstract (Samsung Display Co., Ltd.)
- 18359298. PACKAGES AND PROCESSES FOR RADIO FREQUENCY MITIGATION AND SELF-TEST simplified abstract (Apple Inc.)
- 18362389. TUNABLE TRANSCONDUCTOR simplified abstract (Texas Instruments Incorporated)
- 18363937. DISPLAY DEVICE simplified abstract (Samsung Display Co., Ltd.)
- 18364119. SUBSTRATE INCLUDING TEST CIRCUIT AND SUBSTRATE TEST APPARATUS INCLUDING THE SUBSTRATE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18368195. 3D TAP & SCAN PORT ARCHITECTURES simplified abstract (Texas Instruments Incorporated)
- 18370139. DEVICE AND METHOD FOR SORTING SEMICONDUCTOR CHIP WITH POTENTIAL FAILURE RISK simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18376447. Outlier Integrated Circuit Detection Method and Outlier Integrated Circuit Detection System by Using Machine Learning Frameworks simplified abstract (MEDIATEK INC.)
- 18384910. TEST DEVICE AND TEST SYSTEM FOR SEMICONDUCTOR DEVICES simplified abstract (Samsung Electronics Co., Ltd.)
- 18403623. SCAN ARCHITECTURE FOR INTERCONNECT TESTING IN 3D INTEGRATED CIRCUITS simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
- 18415815. METHOD AND APPARATUS FOR DIAGNOSING A CURRENT SENSOR IN AN ELECTRICALLY OPERATED TECHNICAL DEVICE HAVING A DEVICE BATTERY simplified abstract (Robert Bosch GmbH)
- 18441926. APPARATUS AND TEST ELEMENT GROUP simplified abstract (Micron Technology, Inc.)
- 18444745. PROBE STATION CAPABLE OF MAINTAINING STABLE AND ACCURATE CONTACT TO DEVICE UNDER TEST simplified abstract (NANYA TECHNOLOGY CORPORATION)
- 18460495. SOCKET BOARD AND METHOD FOR INSPECTING A SEMICONDUCTOR DEVICE simplified abstract (Kioxia Corporation)
- 18464529. SYSTEMS AND METHODS FOR ISOLATING FAULTS IN DIE-TO-DIE INTERCONNECTS (Microsoft Technology Licensing, LLC)
- 18468117. Systems and Methods for Wireless Test Modules of a Wireless Harness Automated Measurement System (Lockheed Martin Corporation)
- 18470292. ELECTRONIC DEVICE RELATED TO DETECTION OF INTERNAL VOLTAGE (SK hynix Inc.)
- 18471624. WAFER LEVEL METHODS OF TESTING SEMICONDUCTOR DEVICES USING INTERNALLY-GENERATED TEST ENABLE SIGNALS simplified abstract (Samsung Electronics Co., Ltd.)
- 18478038. FORCE/MEASURE CURRENT GAIN TRIMMING simplified abstract (Texas Instruments Incorporated)
- 18478825. STATE TRANSITION CONTROL FOR PARAMETRIC MEASUREMENT UNIT simplified abstract (Texas Instruments Incorporated)
- 18478850. SOURCE MEASUREMENT UNIT WITH RESISTOR-CAPACITOR CHARGING CIRCUIT simplified abstract (Texas Instruments Incorporated)
- 18481691. SYSTEM AND METHOD FOR TESTING AN INTEGRITY OF A FACE SEAL IN AN ELECTRICAL SYSTEM (Hamilton Sundstrand Corporation)
- 18516106. GALLIUM NITRIDE-BASED DEVICES AND METHODS OF TESTING THEREOF simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
- 18517260. CIRCUIT TEST STRUCTURE AND METHOD OF USING simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)
- 18521432. METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)
- 18526497. TSV TESTING simplified abstract (TEXAS INSTRUMENTS INCORPORATED)
- 18531266. METHODS AND SYSTEMS FOR VERIFYING INTEGRATED CIRCUITS simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18539028. CONTACT INSPECTION DEVICE simplified abstract (SAMSUNG DISPLAY CO., LTD.)
- 18544454. METHOD FOR ESTIMATING PERFORMANCE VALUES OF CHIPS, COMPUTING SYSTEM, AND NON-TRANSITORY COMPUTER-READABLE STORAGE MEDIUM (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.)
- 18556158. METHOD FOR DETERMINING WEAR IN AN ELECTRONIC UNIT, AND TEST APPARATUS simplified abstract (Robert Bosch GmbH)
- 18602732. FLEXIBLE ELECTRIC WIRING SUBSTRATE AND CHIP UNIT AND METHOD OF INSPECTING FLEXIBLE ELECTRIC WIRING SUBSTRATE simplified abstract (CANON KABUSHIKI KAISHA)
- 18606516. WAFER TESTING APPARATUS AND CONTROL METHOD THEREOF simplified abstract (Samsung Electronics Co., Ltd.)
- 18608292. ELECTRICAL DEVICE RELIABILITY PROPERTIES PREDICTION DEVICE AND ELECTRICAL DEVICE RELIABILITY PROPERTIES PREDICTION METHOD simplified abstract (Samsung Electronics Co., Ltd.)
- 18609105. SEMICONDUCTOR TEST APPARATUS AND SEMICONDUCTOR TEST METHOD simplified abstract (Mitsubishi Electric Corporation)
- 18609500. INSPECTION CONNECTOR simplified abstract (Murata Manufacturing Co., Ltd.)
- 18609802. SEMICONDUCTOR TEST DEVICES, SYSTEMS INCLUDING THE SAME, AND METHODS FOR TESTING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 18612205. DISPLAY APPARATUS simplified abstract (Samsung Display Co., Ltd.)
- 18614017. ANALYSIS DEVICE AND RECORDING MEDIUM simplified abstract (ROHM CO., LTD.)
- 18620170. TEST DEVICE AND SEMICONDUCTOR MANUFACTURING APPARATUS INCLUDING TEST DEVICE (Samsung Electronics Co., Ltd.)
- 18621323. DISPLAY SUBSTRATE, MANUFACTURING METHOD THEREOF, AND DISPLAY DEVICE simplified abstract (BOE TECHNOLOGY GROUP CO., LTD.)
- 18621323. DISPLAY SUBSTRATE, MANUFACTURING METHOD THEREOF, AND DISPLAY DEVICE simplified abstract (Chengdu BOE Optoelectronics Technology Co., Ltd.)
- 18624214. SEMICONDUCTOR PACKAGE AND METHOD OF TESTING THE SAME (SAMSUNG ELECTRONICS CO., LTD.)
- 18651462. ENHANCED DIRECT CURRENT (DC) BUILT-IN-SELF-TEST (BIST) COVERAGE FOR OPTICAL ENGINES AND ADVANCED PACKAGING simplified abstract (Cisco Technology, Inc.)
- 18658529. SEMICONDUCTOR DEVICE AND SEMICONDUCTOR PACKAGE (SAMSUNG ELECTRONICS CO., LTD.)
- 18667974. CIRCUIT FOR DETECTING DEFECTS (Samsung Electronics Co., Ltd.)
- 18669800. PROBE HEAD STRUCTURE simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
- 18672047. METHOD AND SYSTEM FOR WAFER-LEVEL TESTING simplified abstract (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.)
- 18712464. SYSTEMS AND STRUCTURES FOR VENTING AND FLOW CONDITIONING OPERATIONS IN INSPECTION SYSTEMS (ASML Netherlands B.V.)
- 18728931. CURRENT DISTURBANCE DETECTION SYSTEM (SIGNIFY HOLDING B.V.)
- 18737847. SHORT-CIRCUIT DETECTION DEVICE (STMicroelectronics International N.V.)
- 18788029. ELECTRONIC DEVICE (InnoLux Corporation)
- 18800813. SEMICONDUCTOR WAFER AND OPERATING METHOD OF TEST CIRCUIT OF SEMICONDUCTOR WAFER (SAMSUNG ELECTRONICS CO., LTD.)
- 18817410. PROBER, PERFORMANCE BOARD, PROBE CARD, AND SUBSTRATE INSPECTING APPARATUS (Kioxia Corporation)
- 18820651. MONITORING CIRCUIT, SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, AND VEHICLE (ROHM CO., LTD.)
- 18882365. METHODS, APPARATUS, AND ARTICLES OF MANUFACTURE TO PERFORM INFIELD TESTING OF A SYSTEM IN A PACKAGE (Intel Corporation)
- 18896345. METHODS AND APPARATUS TO DISENGAGE A TEST HEAD FROM AN INTEGRATED CIRCUIT (IC) DEVICE (Intel Corporation)
- 18942774. MONITORING CIRCUIT AND SEMICONDUCTOR DEVICE (SK hynix Inc.)
- 18956271. SCAN TESTABLE THROUGH SILICON VIAS (TEXAS INSTRUMENTS INCORPORATED)
- 18956642. INFORMATION PROCESSING DEVICE, DISPLAY AND INPUT DEVICE, AND PROGRAM (Tokyo Electron Limited)
- 18957298. CAPTURE AND STORAGE FROM SIGNAL TAP POINTS IN A RADIO (Dell Products L.P.)
- 18959565. DETECTING CIRCUIT FOR DETECTING MEMORY CHIP (NANYA TECHNOLOGY CORPORATION)
- 18963838. NEAR FIELD WIRELESS COMMUNICATION SYSTEM FOR MOTHER TO PACKAGE AND PACKAGE TO PACKAGE SIDEBAND DIGITAL COMMUNICATION (Intel Corporation)
- 18968883. THROUGH-SILICON VIA (TSV) TESTING (Texas Instruments Incorporated)
2
- 20240036107. TEST DEVICE simplified abstract (teCat Technologies (Suzhou) Limited)
- 20240040701. Forming Trench In IC Chip Through Multiple Trench Formation And Deposition Processes simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)
- 20240077531.SYSTEMS AND METHODS FOR SILICON CRACK DETECTION STRUCTURE simplified abstract (apple inc.)
- 20240085478.WAFER-LEVEL MULTI-DEVICE TESTER AND SYSTEM INCLUDING THE SAME simplified abstract (samsung electronics co., ltd.)
A
- Analog Devices International Unlimited Company (20240275500). APPARATUS AND METHODS FOR ELECTRONIC TESTING USING BEAMFORMING INTEGRATED CIRCUITS AS IMPEDANCE TUNERS simplified abstract
- Apple inc. (20240094779). PACKAGES AND PROCESSES FOR RADIO FREQUENCY MITIGATION AND SELF-TEST simplified abstract
- Apple Inc. patent applications on March 21st, 2024
- Audio Technologies patent applications on December 5th, 2024
B
- Blockchain patent applications on 22nd Mar 2024
- Blockchain patent applications on February 1st, 2024
- Blockchain patent applications on February 29th, 2024
- Blockchain patent applications on March 21st, 2024
- Blockchain patent applications on March 28th, 2024
- Blockchain patent applications on May 16th, 2024
C
D
H
I
- Intel corporation (20240175917). ENHANCED JET IMPINGEMENT LEAK PREVENTION FOR INTEGRATED CIRCUIT simplified abstract
- Intel corporation (20240210466). ENHANCED STATIC-DYNAMIC STRESS TECHNIQUES TO ACCELERATE LATENT DEFECTS FOR INTEGRATED CIRCUITS simplified abstract
- Intel corporation (20240219452). METHOD AND SYSTEM FOR A VACUUM COMPATIBLE ELECTRICAL INTERFACE, ENABLING MICROPROCESSOR DEBUG, AT HIGH SPEED, INSIDE AN ELECTRON BEAM PROBE simplified abstract
- Intel corporation (20240329114). DEVICE UNDER TEST (DUT) STRUCTURES IN FILL REGIONS OF PRODUCT DIE FOR VOLTAGE CONTRAST (VC) DEFECT DETECTION FOR IMPROVED YIELD LEARNING simplified abstract
- Intel corporation (20240329122). DEVICE UNDER TEST (DUT) STRUCTURES FOR VOLTAGE CONTRAST (VC) DETECTION OF CONTACT OPENS simplified abstract
- Intel corporation (20250004044). APPARATUS AND METHOD FOR DETECTING WARPAGE IN AN ELECTRONIC SYSTEM
- Intel corporation (20250004046). METHODS, APPARATUS, AND ARTICLES OF MANUFACTURE TO PERFORM INFIELD TESTING OF A SYSTEM IN A PACKAGE
- Intel corporation (20250012853). METHODS AND APPARATUS TO DISENGAGE A TEST HEAD FROM AN INTEGRATED CIRCUIT (IC) DEVICE
- Intel corporation (20250093413). NEAR FIELD WIRELESS COMMUNICATION SYSTEM FOR MOTHER TO PACKAGE AND PACKAGE TO PACKAGE SIDEBAND DIGITAL COMMUNICATION
- Intel Corporation patent applications on February 13th, 2025
- Intel Corporation patent applications on January 2nd, 2025
- Intel Corporation patent applications on January 9th, 2025
- Intel Corporation patent applications on July 4th, 2024
- Intel Corporation patent applications on June 27th, 2024
- Intel Corporation patent applications on March 20th, 2025
- Intel Corporation patent applications on May 30th, 2024
- Intel Corporation patent applications on October 3rd, 2024
- International business machines corporation (20240103065). ACTIVE BRIDGE FOR CHIPLET AND MODULE INTER-COMMUNICATION simplified abstract
- International business machines corporation (20240219450). APPARATUS AND METHOD FOR TIN WHISKER ISOLATION AND DETECTION simplified abstract
- International business machines corporation (20240329115). CONFIGURING A FAULT-SENSING RING OSCILLATOR CIRCUIT simplified abstract
- INTERNATIONAL BUSINESS MACHINES CORPORATION patent applications on February 1st, 2024
- International Business Machines Corporation patent applications on January 18th, 2024
- INTERNATIONAL BUSINESS MACHINES CORPORATION patent applications on July 4th, 2024
- INTERNATIONAL BUSINESS MACHINES CORPORATION patent applications on March 28th, 2024
- International Business Machines Corporation patent applications on October 3rd, 2024
K
- Kioxia corporation (20240094244). SOCKET BOARD AND METHOD FOR INSPECTING A SEMICONDUCTOR DEVICE simplified abstract
- Kioxia corporation (20250093384). PROBER, PERFORMANCE BOARD, PROBE CARD, AND SUBSTRATE INSPECTING APPARATUS
- Kioxia Corporation patent applications on March 20th, 2025
- Kioxia Corporation patent applications on March 21st, 2024
L
M
- Meta platforms technologies, llc (20240288490). Systems and Methods for Adjusting Input-Output Impedance for I/O Interfaces simplified abstract
- Meta Platforms Technologies, LLC patent applications on August 29th, 2024
- Micron technology, inc. (20240255567). MEMORY DEVICE OPERATION BASED ON DEVICE CHARACTERISTICS simplified abstract
- Micron technology, inc. (20240288497). SYSTEM ACCESS BOUNDARY SCAN VIA SYSTEM SIDEBAND SIGNAL CONNECTIONS simplified abstract
- Micron technology, inc. (20240302433). APPARATUS AND TEST ELEMENT GROUP simplified abstract
- Micron Technology, Inc. patent applications on August 1st, 2024
- Micron Technology, Inc. patent applications on August 29th, 2024
- Micron Technology, Inc. patent applications on September 12th, 2024
- Microsoft technology licensing, llc (20250085341). SYSTEMS AND METHODS FOR ISOLATING FAULTS IN DIE-TO-DIE INTERCONNECTS
- Microsoft Technology Licensing, LLC patent applications on March 13th, 2025
- Mitsubishi electric corporation (20240280631). IC NOISE IMMUNITY DETECTION DEVICE AND IC NOISE IMMUNITY DETECTION METHOD simplified abstract
- Mitsubishi electric corporation (20240345156). TEST APPARATUS FOR SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE simplified abstract
- Mitsubishi Electric Corporation patent applications on August 22nd, 2024
- Mitsubishi Electric Corporation patent applications on October 17th, 2024
N
- Nanya technology corporation (20240345135). PREHEATING CONTROL SYSTEM, PREHEATING CONTROL METHOD AND NON-TRANSIENT COMPUTER READABLE STORAGE MEDIUM simplified abstract
- NANYA TECHNOLOGY CORPORATION patent applications on October 17th, 2024
- Nvidia corporation (20240280629). AUTOMATIC BOARD PROBING STATION simplified abstract
- Nvidia corporation (20240353475). INTEGRATED CURRENT MONITOR simplified abstract
- NVIDIA Corporation patent applications on August 22nd, 2024
- NVIDIA Corporation patent applications on October 24th, 2024
