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Category:G01P1/07
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This category has the following 7 subcategories, out of 7 total.
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Pages in category "G01P1/07"
The following 11 pages are in this category, out of 11 total.
1
- 18094569. SENSOR DATA ACQUISITION METHOD AND DEVICES simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18368116. SEMICONDUCTOR POST-PROCESS IMPACT DETECTION DEVICE, SEMICONDUCTOR POST-PROCESS TRANSPORTATION SYSTEM INCLUDING SAME, AND IMPACT LOCATION TRACKING METHOD USING SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 18475115. IMPACT MONITORING SYSTEM (GM Global Technology Operations LLC)
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- Samsung electronics co., ltd. (20240304476). SEMICONDUCTOR POST-PROCESS IMPACT DETECTION DEVICE, SEMICONDUCTOR POST-PROCESS TRANSPORTATION SYSTEM INCLUDING SAME, AND IMPACT LOCATION TRACKING METHOD USING SAME simplified abstract
- Samsung Electronics Co., Ltd. patent applications on September 12th, 2024