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Category:G01N21/359
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This category has the following 17 subcategories, out of 17 total.
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Pages in category "G01N21/359"
The following 27 pages are in this category, out of 27 total.
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- 18275945. INSPECTION DEVICE AND INSPECTION METHOD simplified abstract (Panasonic Intellectual Property Management Co., Ltd.)
- 18378719. MOISTURE DETECTING APPARATUS FOR RECORDING MATERIAL AND IMAGE FORMING APPARATUS simplified abstract (CANON KABUSHIKI KAISHA)
- 18612104. Spectroscopic Device and Shape Measurement Device simplified abstract (SEIKO EPSON CORPORATION)
- 18830876. METHOD OF MEASURING MOISTURE CONTENT OF LIGNOCELLULOSIC BIOMASS AND SAMPLE COMPRESSOR FOR MEASURING SAME (SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION)
- 18882842. SENSOR ASSEMBLY, AGRICULTURAL MACHINE AND ASSOCIATED METHOD (DEERE & COMPANY)
- 18918463. QUALITY MANAGEMENT APPARATUS, QUALITY MANAGEMENT METHOD, AND STORAGE MEDIUM (Konica Minolta, Inc.)
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- Omni Medsci, Inc. (20240225454). CAMERA BASED SYSTEM WITH PROCESSING USING ARTIFICIAL INTELLIGENCE FOR DETECTING ANOMALOUS OCCURRENCES AND IMPROVING PERFORMANCE simplified abstract
- Omni Medsci, Inc. (20240268680). TIME-OF-FLIGHT SENSORS CO-REGISTERED WITH CAMERA SYSTEMS simplified abstract
- Omni Medsci, Inc. (20250009232). TIME-OF-FLIGHT MEASUREMENT ON USER WITH CAMERAS AND POSITION SENSOR
- Omni Medsci, Inc. (20250009233). REMOTE SENSING SYSTEM WITH TIME-OF-FLIGHT SENSOR, ACTIVE ILLUMINATOR AND LIGHT SENSING SYSTEM
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- Panasonic intellectual property management co., ltd. (20240118220). INSPECTION DEVICE AND INSPECTION METHOD simplified abstract
- Panasonic Intellectual Property Management Co., Ltd. patent applications on April 11th, 2024
- Photogrammetry patent applications on 10th Jan 2025
- Photogrammetry patent applications on August 15th, 2024
- Photogrammetry patent applications on January 9th, 2025
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- Seiko epson corporation (20240241051). SPECTROSCOPIC MEASUREMENT METHOD, SPECTROMETER, AND SPECTROSCOPIC MEASUREMENT PROGRAM simplified abstract
- Seiko epson corporation (20240319087). Spectroscopic Device and Shape Measurement Device simplified abstract
- SEIKO EPSON CORPORATION patent applications on July 18th, 2024
- SEIKO EPSON CORPORATION patent applications on September 26th, 2024