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Category:G01N21/33
Subcategories
This category has the following 4 subcategories, out of 4 total.
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S
U
Pages in category "G01N21/33"
The following 13 pages are in this category, out of 13 total.
1
- 17737663. OPTICAL INSPECTION DEVICE AND INSPECTING METHOD USING THE SAME simplified abstract (Samsung Display Co., Ltd.)
- 17958809. METHODS OF GEOLOGIC SAMPLE ANALYSIS simplified abstract (Saudi Arabian Oil Company)
- 18387815. BROADBAND WAFER DEFECT DETECTION simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
- 18465992. INSPECTION TOOL AND INSPECTION METHOD simplified abstract (FUJIFILM Corporation)
- 18611653. CONE PENETROMETER AND METHOD FOR DETECTING MULTI-POLLUTANTS BASED ON TIME DOMAIN REFLECTOMETRY AND LASER INDUCED FLUORESCENCE simplified abstract (Zhejiang University)
- 18887698. LINE-ILLUMINATING LIGHT SOURCE FOR IMAGING APPARATUS, IMAGING APPARATUS INCLUDING THE SAME, AND SKIN ANALYZING APPARATUS INCLUDING THE IMAGING APPARATUS (SAMSUNG ELECTRONICS CO., LTD.)
S
- Samsung electronics co., ltd. (20250093261). LINE-ILLUMINATING LIGHT SOURCE FOR IMAGING APPARATUS, IMAGING APPARATUS INCLUDING THE SAME, AND SKIN ANALYZING APPARATUS INCLUDING THE IMAGING APPARATUS
- Samsung Electronics Co., Ltd. patent applications on March 20th, 2025
- SAMSUNG ELECTRONICS CO., LTD. patent applications on March 20th, 2025