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Category:CPC G01R31/2608
Pages in category "CPC G01R31/2608"
The following 6 pages are in this category, out of 6 total.
1
- 18442731. Arrangement For Monitoring the Condition of a Power Semiconductor Module of an Electric Drive Device simplified abstract (ABB Schweiz AG)
- 18958291. SEMICONDUCTOR DEVICES COMPRISING FAILURE DETECTORS FOR DETECTING FAILURE OF BIPOLAR JUNCTION TRANSISTORS AND METHODS FOR DETECTING FAILURE OF THE BIPOLAR JUNCTION TRANSISTORS (Samsung Electronics Co., Ltd.)
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- Samsung electronics co., ltd. (20250085329). SEMICONDUCTOR DEVICES COMPRISING FAILURE DETECTORS FOR DETECTING FAILURE OF BIPOLAR JUNCTION TRANSISTORS AND METHODS FOR DETECTING FAILURE OF THE BIPOLAR JUNCTION TRANSISTORS
- SAMSUNG ELECTRONICS CO., LTD. Patent Application Trends in 2025
- Samsung Electronics Co., Ltd. patent applications on March 13th, 2025