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Category:CPC G01N21/255
Pages in category "CPC G01N21/255"
The following 38 pages are in this category, out of 38 total.
1
- 18237589. MEASUREMENT APPARATUS AND MEASUREMENT METHOD USING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18292778. METHOD FOR OPERANDO CHARACTERIZATION OF CHEMICAL SPECIES WITHIN A BATTERY USING INFRARED EVANESCENT WAVE SPECTROSCOPY (CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE)
- 18464425. OPTICAL INSPECTION METHOD, NON-TRANSITORY STORAGE MEDIUM, AND OPTICAL INSPECTION APPARATUS simplified abstract (Kabushiki Kaisha Toshiba)
2
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- Kabushiki kaisha toshiba (20240319078). OPTICAL INSPECTION METHOD, NON-TRANSITORY STORAGE MEDIUM, AND OPTICAL INSPECTION APPARATUS simplified abstract
- KABUSHIKI KAISHA TOSHIBA Patent Application Trends in 2024
- Kabushiki Kaisha Toshiba patent applications on September 26th, 2024
- Kioxia Corporation Patent Application Trends in 2024
- Konica Minolta, Inc. Patent Application Trends in 2025
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- Samsung Display Co., LTD Patent Application Trends in 2024
- SAMSUNG DISPLAY CO., LTD. Patent Application Trends in 2024
- Samsung Display Co., Ltd. Patent Application Trends in 2024
- SAMSUNG ELECTRONICS CO., LTD Patent Application Trends in 2024
- Samsung electronics co., ltd. (20240295490). MEASUREMENT APPARATUS AND MEASUREMENT METHOD USING THE SAME simplified abstract
- Samsung Electronics Co., Ltd. Patent Application Trends in 2024
- SAMSUNG ELECTRONICS CO., LTD. Patent Application Trends in 2024
- Samsung electronics Co., Ltd. Patent Application Trends in 2024
- Samsung electronics CO., LTD. Patent Application Trends in 2025
- Samsung Electronics Co., Ltd. patent applications on September 5th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on September 5th, 2024