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Category:CPC A61B5/1172
Pages in category "CPC A61B5/1172"
The following 24 pages are in this category, out of 24 total.
1
- 18281815. TEST JIG, TEST DEVICE, AND TEST METHOD simplified abstract (NEC Corporation)
- 18663600. ELECTRONIC APPARATUS AND CONTROLLING METHOD THEREOF simplified abstract (Samsung Electronics Co., Ltd.)
- 18722677. OPTICAL COHERENCE TOMOGRAPHY ANALYSIS APPARATUS, OPTICAL COHERENCE TOMOGRAPHY ANALYSIS METHOD, AND NON-TRANSITORY RECORDING MEDIUM (NEC Corporation)
N
- Nec corporation (20240306944). TEST JIG, TEST DEVICE, AND TEST METHOD simplified abstract
- Nec corporation (20250064346). OPTICAL COHERENCE TOMOGRAPHY ANALYSIS APPARATUS, OPTICAL COHERENCE TOMOGRAPHY ANALYSIS METHOD, AND NON-TRANSITORY RECORDING MEDIUM
- NEC CORPORATION Patent Application Trends in 2025
- NEC Corporation patent applications on February 27th, 2025
- NEC Corporation patent applications on September 19th, 2024
S
- Samsung Display Co., LTD Patent Application Trends in 2024
- SAMSUNG DISPLAY CO., LTD. Patent Application Trends in 2024
- Samsung Display Co., Ltd. Patent Application Trends in 2024
- Samsung electronics co., ltd. (20240298927). ELECTRONIC APPARATUS AND CONTROLLING METHOD THEREOF simplified abstract
- Samsung electronics Co., Ltd. Patent Application Trends in 2024
- Samsung electronics CO., LTD. Patent Application Trends in 2025
- SAMSUNG ELECTRONICS CO., LTD. Patent Application Trends in 2025
- Samsung Electronics Co., Ltd. patent applications on September 12th, 2024