View source for Category:Marco Jan-Jaco WIELAND

== Marco Jan-Jaco WIELAND ==

=== Executive Summary ===
Marco Jan-Jaco WIELAND is an inventor who has filed 6 patents. Their primary areas of innovation include ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS  (spark-gaps (4 patents), ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS  (spark-gaps (2 patents), with scanning beams {( (2 patents), and they have worked with companies such as ASML Netherlands B.V. (6 patents). Their most frequent collaborators include [[Category:Marie-Claire VAN LARE|Marie-Claire VAN LARE]] (1 collaborations), [[Category:Vincent Sylvester KUIPER|Vincent Sylvester KUIPER]] (1 collaborations), [[Category:Albertus Victor Gerardus MANGNUS|Albertus Victor Gerardus MANGNUS]] (1 collaborations).

=== Patent Filing Activity ===
[[File:Marco_Jan-Jaco_WIELAND_Monthly_Patent_Applications.png|border|800px]]

=== Technology Areas ===
[[File:Marco_Jan-Jaco_WIELAND_Top_Technology_Areas.png|border|800px]]

==== List of Technology Areas ====
* [[:Category:CPC_H01J37/244|H01J37/244]] (ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS  (spark-gaps): 4 patents
* [[:Category:CPC_H01J37/12|H01J37/12]] (ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS  (spark-gaps): 2 patents
* [[:Category:CPC_H01J37/28|H01J37/28]] (with scanning beams {(): 2 patents
* [[:Category:CPC_H01J2237/2817|H01J2237/2817]] (ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS  (spark-gaps): 2 patents
* [[:Category:CPC_G01N23/2251|G01N23/2251]] (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES  (measuring or testing processes other than immunoassay, involving enzymes or microorganisms): 2 patents
* [[:Category:CPC_H01J37/153|H01J37/153]] (External mechanical adjustment of electron or ion optical components  (): 1 patents
* [[:Category:CPC_H01J2237/1534|H01J2237/1534]] (ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS  (spark-gaps): 1 patents
* [[:Category:CPC_H01J37/265|H01J37/265]] (Electron or ion microscopes; Electron or ion diffraction tubes): 1 patents
* [[:Category:CPC_H01J2237/1205|H01J2237/1205]] (ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS  (spark-gaps): 1 patents
* [[:Category:CPC_H01J2237/1207|H01J2237/1207]] (ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS  (spark-gaps): 1 patents
* [[:Category:CPC_G03F7/70325|G03F7/70325]] (PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR;  (phototypographic composing devices): 1 patents
* [[:Category:CPC_G03F7/70558|G03F7/70558]] (PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR;  (phototypographic composing devices): 1 patents
* [[:Category:CPC_G03F7/7065|G03F7/7065]] (PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR;  (phototypographic composing devices): 1 patents
* [[:Category:CPC_G03F7/70655|G03F7/70655]] (PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR;  (phototypographic composing devices): 1 patents
* [[:Category:CPC_G01N2223/6116|G01N2223/6116]] (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES  (measuring or testing processes other than immunoassay, involving enzymes or microorganisms): 1 patents
* [[:Category:CPC_G01N2223/646|G01N2223/646]] (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES  (measuring or testing processes other than immunoassay, involving enzymes or microorganisms): 1 patents
* [[:Category:CPC_H01J37/226|H01J37/226]] (Optical or photographic arrangements associated with the tube {(using a CRT for the display of the image in a scanning electron microscope): 1 patents
* [[:Category:CPC_H01J37/20|H01J37/20]] (Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support {(introducing the objects): 1 patents
* [[:Category:CPC_H01J2237/2482|H01J2237/2482]] (Optical means): 1 patents
* [[:Category:CPC_H01J37/222|H01J37/222]] ({Image processing arrangements associated with the tube  (image data processing or generation, in general): 1 patents
* [[:Category:CPC_H01J2237/221|H01J2237/221]] (Treatment of data  (mixing signals): 1 patents
* [[:Category:CPC_H01J2237/24592|H01J2237/24592]] (ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS  (spark-gaps): 1 patents
* [[:Category:CPC_G01N23/203|G01N23/203]] (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES  (measuring or testing processes other than immunoassay, involving enzymes or microorganisms): 1 patents
* [[:Category:CPC_H01J37/10|H01J37/10]] (Lenses): 1 patents

=== Companies ===
[[File:Marco_Jan-Jaco_WIELAND_Top_Companies.png|border|800px]]

==== List of Companies ====
* ASML Netherlands B.V.: 6 patents

=== Collaborators ===
* [[:Category:Marie-Claire VAN LARE|Marie-Claire VAN LARE]][[Category:Marie-Claire VAN LARE]] (1 collaborations)
* [[:Category:Vincent Sylvester KUIPER|Vincent Sylvester KUIPER]][[Category:Vincent Sylvester KUIPER]] (1 collaborations)
* [[:Category:Albertus Victor Gerardus MANGNUS|Albertus Victor Gerardus MANGNUS]][[Category:Albertus Victor Gerardus MANGNUS]] (1 collaborations)

[[Category:Marco Jan-Jaco WIELAND]]
[[Category:Inventors]]
[[Category:Inventors filing patents with ASML Netherlands B.V.]]