US Patent Application 18450299. DISTANCE MEASUREMENT CORRECTION DEVICE, DISTANCE MEASUREMENT CORRECTION METHOD, AND DISTANCE MEASUREMENT DEVICE simplified abstract
DISTANCE MEASUREMENT CORRECTION DEVICE, DISTANCE MEASUREMENT CORRECTION METHOD, AND DISTANCE MEASUREMENT DEVICE
Organization Name
Inventor(s)
TOMONARI Yoshida of Kariya-city (JP)
DISTANCE MEASUREMENT CORRECTION DEVICE, DISTANCE MEASUREMENT CORRECTION METHOD, AND DISTANCE MEASUREMENT DEVICE - A simplified explanation of the abstract
This abstract first appeared for US patent application 18450299 titled 'DISTANCE MEASUREMENT CORRECTION DEVICE, DISTANCE MEASUREMENT CORRECTION METHOD, AND DISTANCE MEASUREMENT DEVICE
Simplified Explanation
The patent application describes a device that corrects distance measurements by acquiring relevant information for each reflection point on a target.
- The device collects information related to the distance detected for each reflection point.
- It calculates an inclination feature amount for each partial surface of the target, indicating the inclination magnitude relative to a reference surface.
- The device then corrects the distance to each reflection point based on the corresponding inclination feature amount.
Original Abstract Submitted
A distance measurement correction device acquires, for each reflection point on a target, acquires relevant information, which is information related to a distance detected with respect to a pixel corresponding to the reflection point. The device calculates an inclination feature amount related to an inclination magnitude of each partial surface of the target relative to a reference surface, each partial surface of the target including each reflection point, respectively. The device corrects the distance to each reflection point based on the corresponding inclination feature amount.
