US Patent Application 18361254. SYSTEM AND METHOD FOR PERFORMING EXTREME ULTRAVIOLET PHOTOLITHOGRAPHY PROCESSES simplified abstract

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SYSTEM AND METHOD FOR PERFORMING EXTREME ULTRAVIOLET PHOTOLITHOGRAPHY PROCESSES

Organization Name

Taiwan Semiconductor Manufacturing Co., Ltd.

Inventor(s)

Tai-Yu Chen of Hsinchu (TW)

Sagar Deepak Khivsara of Hsinchu (TW)

Kuo-An Liu of Hsinchu (TW)

Chieh Hsieh of Hsinchu (TW)

Shang-Chieh Chien of Hsinchu (TW)

Gwan-Sin Chang of Hsinchu (TW)

Kai Tak Lam of Hsinchu (TW)

Li-Jui Chen of Hsinchu (TW)

Heng-Hsin Liu of Hsinchu (TW)

Chung-Wei Wu of Hsinchu (TW)

Zhiqiang Wu of Hsinchu (TW)

SYSTEM AND METHOD FOR PERFORMING EXTREME ULTRAVIOLET PHOTOLITHOGRAPHY PROCESSES - A simplified explanation of the abstract

This abstract first appeared for US patent application 18361254 titled 'SYSTEM AND METHOD FOR PERFORMING EXTREME ULTRAVIOLET PHOTOLITHOGRAPHY PROCESSES

Simplified Explanation

- The patent application describes a photolithography system that uses tin droplets to generate extreme ultraviolet radiation for photolithography. - The system irradiates the tin droplets with a laser, causing them to become a plasma and emit extreme ultraviolet radiation. - One aspect of the invention is the ability of the system to sense contamination of a collector mirror by the tin droplets. - The system then adjusts the flow of a buffer fluid to reduce the contamination of the collector mirror. - The innovation aims to improve the efficiency and effectiveness of photolithography processes by reducing contamination and maintaining the quality of the collector mirror.


Original Abstract Submitted

A photolithography system utilizes tin droplets to generate extreme ultraviolet radiation for photolithography. The photolithography system irradiates the droplets with a laser. The droplets become a plasma and emit extreme ultraviolet radiation. The photolithography system senses contamination of a collector mirror by the tin droplets and adjusts the flow of a buffer fluid to reduce the contamination.