US Patent Application 18353942. IMAGING DEVICE simplified abstract
Contents
IMAGING DEVICE
Organization Name
Panasonic Intellectual Property Management Co., Ltd.
Inventor(s)
IMAGING DEVICE - A simplified explanation of the abstract
This abstract first appeared for US patent application 18353942 titled 'IMAGING DEVICE
Simplified Explanation
The abstract describes an imaging device that includes various regions on a semiconductor substrate.
- The device has a reference region, a first impurity region, a second impurity region, an element isolation region, and a specific region.
- The reference region contains an impurity of a first conductivity type.
- The first and second impurity regions are located in the reference region and contain an impurity of a second conductivity type.
- The element isolation region is located between the first and second impurity regions and contains an impurity of the first conductivity type.
- The specific region is located between the surface of the semiconductor substrate and the element isolation region, and contains an impurity of the second conductivity type.
Original Abstract Submitted
An imaging device includes a semiconductor substrate including a reference region, a first impurity region, a second impurity region, an element isolation region, and a specific region. The reference region contains an impurity of a first conductivity type. Each of the first impurity region and the second impurity region is located in the reference region and contains an impurity of a second conductivity type. The element isolation region is located between the first impurity region and the second impurity region in plan view, and contains an impurity of the first conductivity type. The specific region is located between a surface of the semiconductor substrate and the element isolation region in a direction perpendicular to the surface, and contains an impurity of the second conductivity type.
