US Patent Application 18344637. MEASUREMENT METHOD AND APPARATUS simplified abstract

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MEASUREMENT METHOD AND APPARATUS

Organization Name

HUAWEI TECHNOLOGIES CO., LTD.


Inventor(s)

Li Zhang of Beijing (CN)


Jing Han of Beijing (CN)


Hong Li of Beijing (CN)


Zhongyi Shen of Beijing (CN)


MEASUREMENT METHOD AND APPARATUS - A simplified explanation of the abstract

  • This abstract for appeared for US patent application number 18344637 Titled 'MEASUREMENT METHOD AND APPARATUS'

Simplified Explanation

The abstract describes a terminal device that is capable of determining the type of measurement gap for a specific group of mobile objects (MOs). It can differentiate between two types of measurement gaps, namely MG (Measurement Gap) and NCSG (Non-Continuous Serving Gap). The terminal then measures the first group of MOs based on the determined measurement gap type. Additionally, the terminal uses this measurement gap type to determine the data transmission behavior in the serving cell of the terminal.


Original Abstract Submitted

A terminal determines whether a measurement gap type corresponding to a first group of MOs is an MG or an NCSG, measures the first group of MOs based on the measurement gap type corresponding to the first group of MOs, and determines a data transmission behavior in a serving cell of the terminal based on the measurement gap type corresponding to the first group of MOs.