US Patent Application 18344303. WAVELENGTH MEASUREMENT CHIP AND WAVELENGTH MEASUREMENT SYSTEM simplified abstract
Contents
WAVELENGTH MEASUREMENT CHIP AND WAVELENGTH MEASUREMENT SYSTEM
Organization Name
Inventor(s)
Stevanus Darmawan of Chiba (JP)
WAVELENGTH MEASUREMENT CHIP AND WAVELENGTH MEASUREMENT SYSTEM - A simplified explanation of the abstract
- This abstract for appeared for US patent application number 18344303 Titled 'WAVELENGTH MEASUREMENT CHIP AND WAVELENGTH MEASUREMENT SYSTEM'
Simplified Explanation
The abstract describes an optical chip that is capable of splitting an incoming electromagnetic wave signal into two signals. These signals are then processed through interferometers to produce multiple output signals. One of the original signals is output as a third signal. The second and third signals can be used to determine the wavelength information of the original signal through optical-electrical conversion. The abstract also mentions the existence of a wavelength measurement system.
Original Abstract Submitted
A optical chip includes: an optical splitter, configured to receive a first electromagnetic wave signal, and divide the first electromagnetic wave signal into two electromagnetic wave signals for output; and a first interferometer and a second interferometer, where the optical splitter, the first interferometer, and the second interferometer are sequentially coupled, and the first interferometer and the second interferometer are configured to receive one of the two electromagnetic wave signals, so that the one electromagnetic wave signal is interfered twice, to output a plurality of second electromagnetic wave signals. The other one of the two electromagnetic wave signals is output as a third electromagnetic wave signal, and the second electromagnetic wave signal and the third electromagnetic wave signal may be used to obtain wavelength information of the first electromagnetic wave signal through optical-electrical conversion. A wavelength measurement system is further provided.
