US Patent Application 18343565. MEASUREMENT METHOD, SCHEDULING METHOD, AND RELATED APPARATUS simplified abstract

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MEASUREMENT METHOD, SCHEDULING METHOD, AND RELATED APPARATUS

Organization Name

HUAWEI TECHNOLOGIES CO., LTD.


Inventor(s)

Li Zhang of Beijing (CN)


Jing Han of Beijing (CN)


Hong Li of Beijing (CN)


Zhongyi Shen of Beijing (CN)


MEASUREMENT METHOD, SCHEDULING METHOD, AND RELATED APPARATUS - A simplified explanation of the abstract

  • This abstract for appeared for US patent application number 18343565 Titled 'MEASUREMENT METHOD, SCHEDULING METHOD, AND RELATED APPARATUS'

Simplified Explanation

This application offers measurement methods and apparatus examples. One method involves determining if a measurement gap is present when measuring multiple objects in a specific bandwidth group. The terminal device can then choose between measurement-gap-based or non-measurement-gap-based measurement based on this determination.


Original Abstract Submitted

This application provides example measurement methods and related example apparatuses. One example measurement method includes determining, by a terminal device and to generate a determining result, whether a measurement gap is involved when each of one or more measurement objects is measured in a first bandwidth part (BWP) group, where the first BWP group includes an active BWP of one or more serving cells of the terminal device. The terminal device can perform measurement-gap-based measurement or non-measurement-gap-based measurement based on the determination.