US Patent Application 18324253. INERTIAL MEASUREMENT DEVICE AND SELF-DIAGNOSIS METHOD OF INERTIAL MEASUREMENT DEVICE simplified abstract
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INERTIAL MEASUREMENT DEVICE AND SELF-DIAGNOSIS METHOD OF INERTIAL MEASUREMENT DEVICE
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INERTIAL MEASUREMENT DEVICE AND SELF-DIAGNOSIS METHOD OF INERTIAL MEASUREMENT DEVICE - A simplified explanation of the abstract
This abstract first appeared for US patent application 18324253 titled 'INERTIAL MEASUREMENT DEVICE AND SELF-DIAGNOSIS METHOD OF INERTIAL MEASUREMENT DEVICE
Simplified Explanation
The abstract describes an inertial measurement device that includes two inertial sensors and a processing circuit.
- The first inertial sensor has a detection axis, and the second inertial sensor has a detection axis in the opposite direction.
- The processing circuit is responsible for executing self-diagnosis based on the ratio of the output amplitudes of the two sensors.
- The self-diagnosis determines if the ratio falls within a reference range.
- The purpose of the self-diagnosis is to ensure the proper functioning of the inertial measurement device.
- This innovation allows for accurate and reliable measurements by detecting any abnormalities or malfunctions in the sensors.
Original Abstract Submitted
An inertial measurement device includes a first inertial sensor having a first detection axis, a second inertial sensor having a second detection axis defined in a direction opposite to the first detection axis, and a processing circuit configured to execute self-diagnosis based on whether a ratio of an amplitude of an output of the first inertial sensor to an amplitude of an output of the second inertial sensor is within a reference range.
