US Patent Application 18324194. Inertial Measurement Device simplified abstract

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Inertial Measurement Device

Organization Name

SEIKO EPSON CORPORATION

Inventor(s)

Kenta Sato of Shiojiri (JP)

Inertial Measurement Device - A simplified explanation of the abstract

This abstract first appeared for US patent application 18324194 titled 'Inertial Measurement Device

Simplified Explanation

The patent application describes an inertial measurement device that includes a board and two inertial sensors.

  • The first inertial sensor is placed on one surface of the board and detects motion along the board.
  • The second inertial sensor is also placed on the same surface of the board but detects motion in the opposite direction to the first sensor.
  • A processing circuit is included to generate a differential signal by subtracting the output signal of the second sensor from the output signal of the first sensor.
  • The differential signal provides information about the motion and orientation of the device.
  • The device can be used in various applications such as navigation systems, motion tracking, and virtual reality.


Original Abstract Submitted

An inertial measurement device includes: a board; a first inertial sensor disposed on one surface of the board and having a first detection axis along the board; a second inertial sensor disposed on the one surface of the board and having a second detection axis defined in a direction opposite to the first detection axis; and a processing circuit configured to generate a differential signal between an output signal of the first inertial sensor and an output signal of the second inertial sensor.